Plasma-based X-ray laser speckle and its application on ferroelectric material

LOW ENERGY ACCELERATOR, RAY TECHNOLOGY AND APPLICATIONS

Plasma-based X-ray laser speckle and its application on ferroelectric material

TAI Ren-Zhong，

Kazumichi NAMIKAWA

Nuclear Science and Techniques

Vol.16, No.4

pp.193-200

Published in print 01 Aug 2005

CLC：O72,O738

22500

A new type of soft X-ray source, i.e. a plasma-based X-ray laser, is found to be promising to conduct transient measurement. By means of picosecond X-ray laser speckles, the dynamic microscopic polarization clusters within cubic (paraelectric) BaTiO₃ was directly observed and characterized in a microscopic scale for the first time. This opens a way to study this type of clusters, which usually manifest large external-field response for ferroelectric materials.

Plasma-based X-ray laser speckleParaelectric BaTiO3Ferroelectric materialsPolarization cluster

References

[1]

Sutton M, Mochrie S G J, Greytak T, et al. Nature, 1991, 352: 608

[2]

Cai Z H, Lai B, Yun W B, et al. Phys Rev Lett, 1994, 73: 82

[3]

Brauer S, Stephanson G B, Satton M, et al. Phys Rev Lett, 1995, 74: 2010

[4]

Lurio L B, Lumma D, Sandy A R, et al. Phys Rev Lett, 2000, 84: 785

[5]

Yakhon F, Letoublon A, Livet F, et al. ESRF Newsletter, 1999, 32: 12

[6]

Mochrie S G, Mayers A M, Sandy A R, et al. Phys Rev Lett, 1997, 78: 1275

[7]

Key M H. Nature (London), 1985, 316: 314

[8]

Daido H, C R Acad Sci Paris, 2000, 4: 999

[9]

Kawachi T, Tanaka M, Hasegawa N, et al. Phys Rev, 2002, A 66: 033815

[10]

See, for example,

DESY Report No. 2001-011

, edited by Materilik G and Tschentscher Th, 2001

Baidu Scholar

Google Scholar

[11]

See, for example, Xu Y, Ferroelectric material and their applications, Amsterdam: Elsevier Science, 1991

[12]

Cochran W. Adv Phys, 1960, 9: 387;

Cochran W. Adv Phys, 1961, 10: 401

[13]

Harada J, Axe J D, Shirane G. Phys Rev, 1971, B 4: 155

[14]

Luspin Y, Servoin J L, Gervais F. J Phys, 1980, C 13: 3761

[15]

Comes R, Lambert M, Guinier A. Solid State Commun, 1968, 6:715

[16]

Vogt H, Sanjurjo J A, Rossbroich G. Phys Rev, 1982, B 26: 5904

[17]

Inoue K. Ferroelectrics, 1983, 52: 253

[18]

Zalar B, Laguta V V, Blinc R. Phys Rev Lett, 2003, 90: 037601

[19]

Stachiotti M, Dobry A, Migoni R, et al. Phys Rev, 1993, B 47: 2473

[20]

Takahasi H. J Phys Soc Jpn, 1961, 16: 1685

[21]

Yamada Y, Shirane G, Linz A. Phys Rev, 1969,177: 848

[22]

Motegi H, Mitsui T. J Phys Chem Solids, 1964, 25: 253

[23]

Burns G, Dacol F H. Solid State Commun, 1982, 42: 9

[24]

Takagi M, Ishidate T. Solid State Commun, 2000, 113: 423

[25]

Tai R Z, Namikawa K, Kishimoto M, et al. Phys Rev Lett, 2002, 89: 257602

[26]

Tai R Z, Namikawa K, Sawada A, et al. Phys Rev Lett, 2004, 93: 087601

[27]

Tai R Z, Namikawa K, Kishimoto M, et al. in Eighth International Conference on Synchrotron Radiation Instrumentation, San Francisco, California, 2003, edited by Warwick T et al., AIP Conf. Proc. No. 705 AIP, New York, 2004: 1122

[28]

Tang H, Daido H, Kishimoto M, et al. Jpn J Appl Phys Part 1, 2003, 42(2A): 443

[29]

Takashige M, Hamazaki S, Takahashi Y, et al. Jpn J Appl Phys, Part 1, 1999, 38: 5686

[30]

Thompson A C, Lindau I, Attwood A, et al. X-ray data booklet, Berkeley, California, 2001: 1-5

[31]

Born M, Wolf E. Principles of optics, Oxford: Pergamon, 1965: 382, 680

[32]

Gehring P M, Wakimoto S, Ye Z G, et al. Phys Rev Lett, 2001, 87: 277601

[33]

Ang C, Yu Z, Jing Z. Phys Rev, 2000, B 61: 957