Sulfonated polyetherketone (SPEK-C) films investigated by positron annihilation lifetime spectroscopy and atomic force microscopy

LOW ENERGY ACCELERATOR, RAY TECHNOLOGY AND APPLICATIONS

Sulfonated polyetherketone (SPEK-C) films investigated by positron annihilation lifetime spectroscopy and atomic force microscopy

Htwe Htwe Yin，

YIN Ze-Jie，

TANG Shi-Biao，

HUANG Huan，

ZHU Da-Ming

Nuclear Science and Techniques

Vol.16, No.6

pp.341-346

Published in print 01 Dec 2005

CLC：O63,O571.3,TH742

26900

The characterization of sulfonated polyetherketone (SPEK-C) films was investigated by using positron annihilation lifetime spectroscopy (PALS) and atomic force microscopy (AFM). It was found that free volume radius and intensity depend on the variation of sulfonation degree and solvent evaporation time of the films. Pore size and distribution determined from PALS and AFM measurements showed reasonable agreement.

Atomic force microscopy (AFM)Sulfonated polyetherketone (SPEK-C)Sulfonation degreePositron lifetimeFree volumePore size

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