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Measurement of Sc and V K-shell ionization cross sections by slow electron impact

Measurement of Sc and V K-shell ionization cross sections by slow electron impact

Li Tai-Hua
An Zhu
Luo Zheng-Ming
Nuclear Science and TechniquesVol.7, No.4pp.228-231Published in print 01 Nov 1996
21200

Electron-induced Sc and V K-shell ionization cross sections, which are scarce, have been obtained from measurement of Kα X-ray emission cross sections at energies from near threshold to 25 keV. The influence of substrate of thin targets on ionization cross sections has been corrected using the bipartition model of electron transport.

Electron-induced K-shell ionization cross sectionsThin target with thick substrateElectron transport
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