Readout electronics for a high resolution soft X-ray spectrometer based on silicon drift detector

Er-Lei Chen; Chang-Qing Feng; Shu-Bin Liu; Chun-Feng Ye; Dong-Dong Jin; Jian Lian; Hui-Jun Hu

doi:10.1007/s41365-016-0160-0

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Readout electronics for a high resolution soft X-ray spectrometer based on silicon drift detector

NUCLEAR ELECTRONICS AND INSTRUMENTATION | Updated：2021-02-23

- Readout electronics for a high resolution soft X-ray spectrometer based on silicon drift detector
- Nuclear Science and Techniques Vol. 28, Issue 1, Article number: 14(2017)
- Affiliations：
  
  1.State Key Laboratory of Particle Detection and Electronics, University of Science and Technology of China, Hefei, 230026, China.
  2.Department of Modern Physics, University of Science and Technology of China, Hefei, 230026, China.
  3.705 Research Division, Electronic Engineering Institute, Hefei, 230037, China.
  4.Shandong Aerospace Electro-technology Institute, Yantai, 264670, China.
- Author bio：
  
  Corresponding author: Chang-Qing Feng, E-mail: fengcq@ustc.edu.cn
- Funds：
- DOI：10.1007/s41365-016-0160-0
  CLC：
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Er-Lei Chen, Chang-Qing Feng, Shu-Bin Liu, et al. Readout electronics for a high resolution soft X-ray spectrometer based on silicon drift detector. [J]. Nuclear Science and Techniques 28(1):14(2017)
DOI：

Er-Lei Chen, Chang-Qing Feng, Shu-Bin Liu, et al. Readout electronics for a high resolution soft X-ray spectrometer based on silicon drift detector. [J]. Nuclear Science and Techniques 28(1):14(2017) DOI： 10.1007/s41365-016-0160-0.

摘要

Abstract

The readout electronics for a prototype soft X-ray spectrometer based on Silicon Drift Detector (SDD), for precisely measuring the energy and arrival time of X-ray photons, is presented in this paper. The system mainly consists of two parts, i.e., an analog electronics section (including a pre-amplifier, a signal shaper and filter, a constant fraction timing circuit, and a peak-hold circuit) and a digital electronics section (including an ADC and a TDC). Test results with X-ray sources show that an energy dynamic range of 1–10 keV with an integral non-linearity of less than 0.1% can be achieved, and the energy resolution is better than 160 eV @ 5.9 keV FWHM. Using a waveform generator, test results also indicate that time resolution of the electronics system is about 3.7 ns, which is much less than the transit time spread of SDD (< 100 ns) and satisfies the requirements of future applications.

关键词

Keywords

Energy and time measurementSoft X-ray detectionSilicon drift detectorReadout electronics

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