Your Location:
Home >
Browse articles >
Electrostatic-lenses position-sensitive TOF MCP detector for beam diagnostics and new scheme for mass measurements at HIAF
NUCLEAR ELECTRONICS AND INSTRUMENTATION | Updated:2021-02-01
    • Electrostatic-lenses position-sensitive TOF MCP detector for beam diagnostics and new scheme for mass measurements at HIAF

    • Nuclear Science and Techniques   Vol. 30, Issue 10, Article number: 152(2019)
    • DOI:10.1007/s41365-019-0676-1    

      CLC:

    Scan for full text

  • Jun-Hao Liu, Zhuang Ge, Qian Wang, et al. Electrostatic-lenses position-sensitive TOF MCP detector for beam diagnostics and new scheme for mass measurements at HIAF. [J]. Nuclear Science and Techniques 30(10):152(2019) DOI: 10.1007/s41365-019-0676-1.

  •  

0

Views

0

Downloads

0

CSCD

Alert me when the article has been cited
Submit
Tools
Download
Export Citation
Share
Add to favorites
Add to my album

Related Articles

Simulation and test of the SLEGS TOF spectrometer at SSRF
Graded composition and doping p-i-n AlxGa1-xAs/GaAs detector for unbiased voltage operation
Development of an ultrafast detector and demonstration of its oscillographic application
Two-plane painting injection scheme for BRing of HIAF
Development of an innovative detection system for pebble bed kinematic studies

Related Author

No data

Related Institution

School of Physics and Microelectronics, Zhengzhou University
School of Nuclear Science and Technology, University of South China
School of Nuclear Science and Technology, Lanzhou University
Key Laboratory of Nuclear Physics and Ion-beam Application (MOE), Institute of Modern Physics, Fudan University
University of Chinese Academy of Science
0