Yiyuan WANG, Wu LU, Diyuan REN, et al. Dose-rate effects of low-dropout voltage regulator at various biases. [J]. Nuclear Science and Techniques 21(6):352-356(2010)
DOI:
Yiyuan WANG, Wu LU, Diyuan REN, et al. Dose-rate effects of low-dropout voltage regulator at various biases. [J]. Nuclear Science and Techniques 21(6):352-356(2010) DOI: 10.13538/j.1001-8042/nst.21.352-356.
Dose-rate effects of low-dropout voltage regulator at various biases
A low-dropout voltage regulator, LM2941, was irradiated by ,60,Co ,γ,-rays at various dose rates and biases for investigating the total dose and dose rate effects. The radiation responses show that the key electrical parameters, including its output and dropout voltage, and the maximum output current, are sensitive to total dose and dose rates, and are significantly degraded at low dose rate and zero bias. The integrated circuits damage change with the dose rates and biases, and the dose-rate effects are relative to its electric field.
关键词
Keywords
Dose rate effectsELDRSIonizing radiationLDO voltage regulator
references
Pease R L, McClure S, Gorelick J, et al. IEEE Trans Nucl Sci, 1998, 45: 2571-2575.
Ramachandran V, Narasimham B, Fleetwood D M, et al. IEEE Trans Nucl Sci, 2006, 53: 3223-3231.
Beacour J T, Carriere T, Gach A, et al. IEEE Trans Nucl Sci, 1994, 41: 2420-2426.
Abare W, Brueggeman F, Pease R, et al. 2002 IEEE Radiation Effects Data Workshop Record. 2002, 1-5.
Freitag R K, Brown D B. IEEE Trans Nucl Sci, 1997, 44: 1906-1913.
Fleetwood D M, Riewe L C, Schwank J R, et al. IEEE Trans Nucl Sci, 1996, 43: 2537-2546.
Witczak S C, Lacoe R C, Mayer D C, et al. IEEE Trans Nucl Sci, 1998, 45: 2339-2351.
Fleetwood D M, Kosier S L, Nowlin R N, et al. IEEE Trans Nucl Sci, 1994, 41: 1871-1883.
Rashkeev S C, Schrimpf R D, Fleetwood D M, et al. IEEE Trans Nucl Sci, 2002, 49: 2650-2655.
Witczak S C, Schrimpf R D, Fleetwood D M, et al. IEEE Trans Nucl Sci, 1997, 44: 1989-2000.
Zheng Yu, Lu W, Ren D, et al. Nucl Tech, 2008, 31: 270-274.(in Chinese)
Boch J, Saigne F, Schrimpf R D, et al. IEEE Trans Nucl Sci, 2006, 53: 3655-3660.