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Single-event-effect propagation investigation on nanoscale system on chip by applying heavy-ion microbeam and event tree analysis

NUCLEAR ENERGY SCIENCE AND ENGINEERING | Updated：2021-11-29

- Single-event-effect propagation investigation on nanoscale system on chip by applying heavy-ion microbeam and event tree analysis Cover Article Enhanced Publication
- Nuclear Science and Techniques Vol.32, Issue 10, (2021)
- Affiliations：
  
  School of Nuclear Science and Technology, Xi'an Jiaotong University,Xi'an,China,710049;National Innovation Center of Radiation Application, China Institute of Atomic Energy,Beijing,China,102413;Dipartimento di Automatica e Informatica, Politecnico di Torino,Torino,Italy,10129;School of Nuclear Science and Technology, University of South China,Hengyang,China,421001
- Author bio：
- Funds：
- DOI：10.1007/s41365-021-00943-6 CLC：
- Published：01 October 2021，
  
  Published Online：04 October 2021，
  
  Received：18 June 2021，
  
  Revised：13 August 2021，
  
  Accepted：21 August 2021
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Cite this article
Wei-Tao Yang, Xue-Cheng Du, Yong-Hong Li, et al. Single-event-effect propagation investigation on nanoscale system on chip by applying heavy-ion microbeam and event tree analysis. [J]. Nuclear Science and Techniques 32(10):106(2021)
DOI：

Wei-Tao Yang, Xue-Cheng Du, Yong-Hong Li, et al. Single-event-effect propagation investigation on nanoscale system on chip by applying heavy-ion microbeam and event tree analysis. [J]. Nuclear Science and Techniques 32(10):106(2021) DOI： 10.1007/s41365-021-00943-6.

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Single-event-effect propagation investigation on nanoscale system on chip by applying heavy-ion microbeam and event tree analysis Cover Article Enhanced Publication