Influencing factors on local reduction of graphene oxide with a heated AFM tip

Zhongliang WU; Yue SHEN; Xingfei ZHOU; Shouwu GUO; Yi ZHANG

doi:10.13538/j.1001-8042/nst.22.245-250

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Influencing factors on local reduction of graphene oxide with a heated AFM tip

INTERDISCIPLINARY STUDIES | Updated：2021-01-29

- Influencing factors on local reduction of graphene oxide with a heated AFM tip
- Nuclear Science and Techniques Vol. 22, Issue 4, (2011)
- Affiliations：
  
  1.Ningbo University, Zhejiang 315211, China
  2.Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai 201800, China
  3.Research Institute of Micro/Nano Science and Technology, Shanghai Jiao Tong University, Shanghai 200240, China
- Author bio：
  
  Corresponding author. E-mail address: zhangyi@sinap.ac.cn; zhouxingfei@nbu.edu.cn
  
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  Corresponding author. E-mail address: zhangyi@sinap.ac.cn; zhouxingfei@nbu.edu.cn
  
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- Funds：
- DOI：10.13538/j.1001-8042/nst.22.245-250 CLC：
- Published：20 August 2011，
  
  Received：04 May 2011，
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Cite this article
Zhongliang WU, Yue SHEN, Xingfei ZHOU, et al. Influencing factors on local reduction of graphene oxide with a heated AFM tip. [J]. Nuclear Science and Techniques 22(4):245-250(2011)
DOI：

Zhongliang WU, Yue SHEN, Xingfei ZHOU, et al. Influencing factors on local reduction of graphene oxide with a heated AFM tip. [J]. Nuclear Science and Techniques 22(4):245-250(2011) DOI： 10.13538/j.1001-8042/nst.22.245-250.

Influencing factors on local reduction of graphene oxide with a heated AFM tip 1 2 first-author 2 1 corresp Corresponding author. E-mail address: zhangyi@sinap.ac.cn; zhouxingfei@nbu.edu.cn Corresponding author. E-mail address: zhangyi@sinap.ac.cn; zhouxingfei@nbu.edu.cn zhangyi@sinap.ac.cn 3 2 corresp Corresponding author. E-mail address: zhangyi@sinap.ac.cn; zhouxingfei@nbu.edu.cn Corresponding author. E-mail address: zhangyi@sinap.ac.cn; zhouxingfei@nbu.edu.cn zhangyi@sinap.ac.cn Ningbo University, Zhejiang 315211, China Ningbo University, Zhejiang 315211, China Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai 201800, China Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai 201800, China Research Institute of Micro/Nano Science and Technology, Shanghai Jiao Tong University, Shanghai 200240, China Research Institute of Micro/Nano Science and Technology, Shanghai Jiao Tong University, Shanghai 200240, China In this paper, the factors influencing the local thermal reduction of graphene oxide (GO) sheets are investigated. The lateral force microscopy and scanning polarization force microscopy verify that the heated tips of atomic force microscope (AFM) can thermally reduce the GO into electrical conductive nanostructures. 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