Influencing factors on local reduction of graphene oxide with a heated AFM tip

Zhongliang WU; Yue SHEN; Xingfei ZHOU; Shouwu GUO; Yi ZHANG

doi:10.13538/j.1001-8042/nst.22.245-250

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Influencing factors on local reduction of graphene oxide with a heated AFM tip

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- Influencing factors on local reduction of graphene oxide with a heated AFM tip
- Influencing factors on local reduction of graphene oxide with a heated AFM tip
- 核技术（英文版） 2011年22卷第4期
- 作者机构：
  
  1.Ningbo University, Zhejiang 315211, China
  2.Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai 201800, China
  3.Research Institute of Micro/Nano Science and Technology, Shanghai Jiao Tong University, Shanghai 200240, China
- 作者简介：
  
  Corresponding author. E-mail address: zhangyi@sinap.ac.cn; zhouxingfei@nbu.edu.cn
  
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  Corresponding author. E-mail address: zhangyi@sinap.ac.cn; zhouxingfei@nbu.edu.cn
  
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- 基金信息：
- DOI：10.13538/j.1001-8042/nst.22.245-250 中图分类号：
- 纸质出版日期：2011-08-20，
  
  收稿日期：2011-05-04，
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引用本文
Zhongliang WU, Yue SHEN, Xingfei ZHOU, 等. Influencing factors on local reduction of graphene oxide with a heated AFM tip[J]. 核技术（英文版）, 2011, 22(4):245-250.

Zhongliang WU, Yue SHEN, Xingfei ZHOU, et al. Influencing factors on local reduction of graphene oxide with a heated AFM tip[J]. Nuclear Science and Techniques, 2011, 22(4):245-250.
Zhongliang WU, Yue SHEN, Xingfei ZHOU, 等. Influencing factors on local reduction of graphene oxide with a heated AFM tip[J]. 核技术（英文版）, 2011, 22(4):245-250. DOI： 10.13538/j.1001-8042/nst.22.245-250.

Zhongliang WU, Yue SHEN, Xingfei ZHOU, et al. Influencing factors on local reduction of graphene oxide with a heated AFM tip[J]. Nuclear Science and Techniques, 2011, 22(4):245-250. DOI： 10.13538/j.1001-8042/nst.22.245-250.

Influencing factors on local reduction of graphene oxide with a heated AFM tip 1 2 first-author 2 1 corresp Corresponding author. E-mail address: zhangyi@sinap.ac.cn; zhouxingfei@nbu.edu.cn Corresponding author. E-mail address: zhangyi@sinap.ac.cn; zhouxingfei@nbu.edu.cn zhangyi@sinap.ac.cn 3 2 corresp Corresponding author. E-mail address: zhangyi@sinap.ac.cn; zhouxingfei@nbu.edu.cn Corresponding author. E-mail address: zhangyi@sinap.ac.cn; zhouxingfei@nbu.edu.cn zhangyi@sinap.ac.cn Ningbo University, Zhejiang 315211, China Ningbo University, Zhejiang 315211, China Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai 201800, China Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai 201800, China Research Institute of Micro/Nano Science and Technology, Shanghai Jiao Tong University, Shanghai 200240, China Research Institute of Micro/Nano Science and Technology, Shanghai Jiao Tong University, Shanghai 200240, China In this paper, the factors influencing the local thermal reduction of graphene oxide (GO) sheets are investigated. The lateral force microscopy and scanning polarization force microscopy verify that the heated tips of atomic force microscope (AFM) can thermally reduce the GO into electrical conductive nanostructures. 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