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Mass thickness measurements for dual-component samples utilizing equivalent energy of X-rays

LOW ENERGY ACCELERATOR, RAY AND APPLICATIONS | Updated：2021-01-20

- Mass thickness measurements for dual-component samples utilizing equivalent energy of X-rays Cover Article Enhanced Publication
- Nuclear Science and Techniques Vol.25, Issue 4, (2014)
- Affiliations：
  
  Department of Computer and Technology, Nanjing Institute of Technology,Nanjing,China,211167
- Author bio：
- Funds：
- DOI：10.13538/j.1001-8042/nst.25.040202 CLC：
- Published：20 August 2014，
  
  Published Online：27 July 2014，
  
  Received：18 November 2013，
  
  Revised：，
  
  Accepted：03 March 2014
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Cite this article
Min-Cong CHEN, Li-Hong TIAN. Mass thickness measurements for dual-component samples utilizing equivalent energy of X-rays. [J]. Nuclear Science and Techniques 25(4):040202(2014)
DOI：

Min-Cong CHEN, Li-Hong TIAN. Mass thickness measurements for dual-component samples utilizing equivalent energy of X-rays. [J]. Nuclear Science and Techniques 25(4):040202(2014) DOI： 10.13538/j.1001-8042/nst.25.040202.

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Mass thickness measurements for dual-component samples utilizing equivalent energy of X-rays Cover Article Enhanced Publication