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1.Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai201800, China
2.University of Chinese Academy of Sciences, Beijing100049, China
3.Department of Engineering Physics, Tsinghua University, Beijing100084, China
4.Shanghai Key Laboratory of Cryogenics & Superconducting RF Technology, Shanghai201800, China
Corresponding author, zhaozhentang@sinap.ac.cn
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Published:20 December 2014,
Published Online:06 December 2014,
Received:20 June 2013,
Accepted:27 August 2014
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Cite this article
Jian-Hao TAN, Qiang GU, Wen-Cheng FANG, et al. X-band deflecting cavity design for ultra-short bunch length measurement of SXFEL at SINAP. [J]. Nuclear Science and Techniques 25(6):060101(2014)
Jian-Hao TAN, Qiang GU, Wen-Cheng FANG, et al. X-band deflecting cavity design for ultra-short bunch length measurement of SXFEL at SINAP. [J]. Nuclear Science and Techniques 25(6):060101(2014) DOI: 10.13538/j.1001-8042/nst.25.060101.
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