谭建豪; 顾强; 方文程; 童德春; 赵振堂

doi:10.13538/j.1001-8042/nst.25.060101

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X-band deflecting cavity design for ultra-short bunch length measurement of SXFEL at SINAP

SYNCHROTRON RADIATION TECHNOLOGY AND APPLICATIONS | 更新时间：2021-01-20

- X-band deflecting cavity design for ultra-short bunch length measurement of SXFEL at SINAP 封面论文增强出版
- X-band deflecting cavity design for ultra-short bunch length measurement of SXFEL at SINAP
- 核技术（英文版） 2014年 25卷第6期 (2014)
- 作者机构：
  
  Shanghai Institute of Applied Physics, Chinese Academy of Sciences,Shanghai,China,201800;University of Chinese Academy of Sciences,Beijing,China,100049;Department of Engineering Physics, Tsinghua University,Beijing,China,100084;Shanghai Key Laboratory of Cryogenics & Superconducting RF Technology,Shanghai,China,201800
- 作者简介：
- 基金信息：
  
  Knowledge Innovation Project of the Chinese Academy of Sciences
- DOI：10.13538/j.1001-8042/nst.25.060101 中图分类号：
- 纸质出版日期：2014-12-20，
  
  网络出版日期：2014-12-06，
  
  收稿日期：2013-06-20，
  
  修回日期：，
  
  录用日期：2014-08-27
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引用本文
谭建豪, 顾强, 方文程, 等. X-band deflecting cavity design for ultra-short bunch length measurement of SXFEL at SINAP[J]. 核技术（英文版）, 2014, 25(6):060101

Jian-Hao TAN, Qiang GU, Wen-Cheng FANG, et al. X-band deflecting cavity design for ultra-short bunch length measurement of SXFEL at SINAP[J]. Nuclear Science and Techniques, 2014, 25(6):060101
谭建豪, 顾强, 方文程, 等. X-band deflecting cavity design for ultra-short bunch length measurement of SXFEL at SINAP[J]. 核技术（英文版）, 2014, 25(6):060101 DOI： 10.13538/j.1001-8042/nst.25.060101.

Jian-Hao TAN, Qiang GU, Wen-Cheng FANG, et al. X-band deflecting cavity design for ultra-short bunch length measurement of SXFEL at SINAP[J]. Nuclear Science and Techniques, 2014, 25(6):060101 DOI： 10.13538/j.1001-8042/nst.25.060101.

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X-band deflecting cavity design for ultra-short bunch length measurement of SXFEL at SINAP 封面论文 增强出版

X-band deflecting cavity design for ultra-short bunch length measurement of SXFEL at SINAP 封面论文增强出版