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Studies of multilayer structure in depth direction by soft X-ray spectroscopy

SYNCHROTRON TECHNOLOGY AND APPLICATIONS | Updated：2021-01-29

- Studies of multilayer structure in depth direction by soft X-ray spectroscopy Cover Article Enhanced Publication
- Nuclear Science and Techniques Vol.17, Issue 5, (2006)
- Affiliations：
  
  Shanghai Dianji University;Institute of Composite Materials, Shanghai Jiaotong University;Saga University Synchrotron Light Application Center,Shanghai;Shanghai,China;China;Japan,200240;200030;Institute of Multidisciplinary Research for Advanced Materials, Tohoku University,Japan
- Author bio：
- Funds：
- DOI：10.1016/S1001-8042(06)60048-1 CLC： TH744.15,TM203
- Published：20 October 2006，
  
  Published Online：，
  
  Received：15 August 2006，
  
  Revised：，
  
  Accepted：
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Cite this article
M. WATANABE, T. EJIMA, N. MIYATA, et al. Studies of multilayer structure in depth direction by soft X-ray spectroscopy. [J]. Nuclear Science and Techniques 17(5):257-267(2006)
DOI：

M. WATANABE, T. EJIMA, N. MIYATA, et al. Studies of multilayer structure in depth direction by soft X-ray spectroscopy. [J]. Nuclear Science and Techniques 17(5):257-267(2006) DOI： 10.1016/S1001-8042(06)60048-1.

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Studies of multilayer structure in depth direction by soft X-ray spectroscopy Cover Article Enhanced Publication