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Effect of hydrogen on SiC-C films with AES and XPS analyses

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- Effect of hydrogen on SiC-C films with AES and XPS analyses Cover Article Enhanced Publication
- Nuclear Science and Techniques Vol.14, Issue 1, (2003)
- Affiliations：
  
  Lab. for Radiation Physics and Technology of Education Ministry of China, Institute of Nuclear Science and Technology, Sichuan University,Chengdu,610064
- Author bio：
- Funds：
- DOI： CLC： TQ163,O484.5
- Published：01 February 2003，
  
  Published Online：，
  
  Received：14 October 2002，
  
  Revised：，
  
  Accepted：
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Ning-Kang HUANG, Bin YANG, Qi XIONG, et al. Effect of hydrogen on SiC-C films with AES and XPS analyses. [J]. Nuclear Science and Techniques 14(1):56-59(2003)
DOI：

Ning-Kang HUANG, Bin YANG, Qi XIONG, et al. Effect of hydrogen on SiC-C films with AES and XPS analyses. [J]. Nuclear Science and Techniques 14(1):56-59(2003) DOI：

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Effect of hydrogen on SiC-C films with AES and XPS analyses Cover Article Enhanced Publication