王晓辉; 童腾; 苏弘; 刘杰; 张战刚; 古松; 刘天奇; 孔洁; 赵兴文; 杨振雷

doi:10.13538/j.1001-8042/nst.26.030401

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A flexible and robust soft-error testing system for microelectronic devices and integrated circuits

NUCLEAR ELECTRONICS AND INSTRUMENTATION | 更新时间：2021-01-20

- A flexible and robust soft-error testing system for microelectronic devices and integrated circuits 封面论文增强出版
- A flexible and robust soft-error testing system for microelectronic devices and integrated circuits
- 核技术（英文版） 2015年 26卷第3期 (2015)
- 作者机构：
  
  Institute of Modern Physics, Chinese Academy of Sciences,Lanzhou,China,730000;University of Chinese Academy of Sciences,Beijing,China,100049
- 作者简介：
- 基金信息：
  
  National Natural Science Foundation of China;Knowledge Innovation Program of The Chinese Academy of Sciences
- DOI：10.13538/j.1001-8042/nst.26.030401 中图分类号：
- 纸质出版日期：2015-06-20，
  
  网络出版日期：2015-06-20，
  
  收稿日期：2014-08-15，
  
  修回日期：，
  
  录用日期：2014-09-23
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王晓辉, 童腾, 苏弘, 等. A flexible and robust soft-error testing system for microelectronic devices and integrated circuits[J]. 核技术（英文版）, 2015, 26(3):030401

Xiao-Hui WANG, Teng TONG, Hong SU, et al. A flexible and robust soft-error testing system for microelectronic devices and integrated circuits[J]. Nuclear Science and Techniques, 2015, 26(3):030401
王晓辉, 童腾, 苏弘, 等. A flexible and robust soft-error testing system for microelectronic devices and integrated circuits[J]. 核技术（英文版）, 2015, 26(3):030401 DOI： 10.13538/j.1001-8042/nst.26.030401.

Xiao-Hui WANG, Teng TONG, Hong SU, et al. A flexible and robust soft-error testing system for microelectronic devices and integrated circuits[J]. Nuclear Science and Techniques, 2015, 26(3):030401 DOI： 10.13538/j.1001-8042/nst.26.030401.

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A flexible and robust soft-error testing system for microelectronic devices and integrated circuits 封面论文 增强出版

A flexible and robust soft-error testing system for microelectronic devices and integrated circuits 封面论文增强出版