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X-ray detection based on complementary metal–oxide–semiconductor sensors

NUCLEAR ELECTRONICS AND INSTRUMENTATION | Updated：2021-02-01

- X-ray detection based on complementary metal–oxide–semiconductor sensors Cover Article Enhanced Publication
- Nuclear Science and Techniques Vol.30, Issue 1, (2019)
- Affiliations：
  
  College of Physics and Materials Science, Henan Normal University,Xinxiang,China,453007;College of Electronic and Electrical Engineering, Henan Normal University,Xinxiang,China,453007;Chongqing Cancer Hospital,Chongqing,China,400030
- Author bio：
- Funds：
- DOI：10.1007/s41365-018-0528-4 CLC：
- Published：01 January 2019，
  
  Published Online：02 January 2019，
  
  Received：07 August 2018，
  
  Revised：23 October 2018，
  
  Accepted：03 November 2018
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Cite this article
Qian-Qian Cheng, Chun-Wang Ma, Yan-Zhong Yuan, et al. X-ray detection based on complementary metal–oxide–semiconductor sensors. [J]. Nuclear Science and Techniques 30(1):9(2019)
DOI：

Qian-Qian Cheng, Chun-Wang Ma, Yan-Zhong Yuan, et al. X-ray detection based on complementary metal–oxide–semiconductor sensors. [J]. Nuclear Science and Techniques 30(1):9(2019) DOI： 10.1007/s41365-018-0528-4.

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