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1.Science and Technology on Reliability Physics and Application of Electronic Component Laboratory, China Electronic Product Reliability and Environmental Testing Research Institute, Guangzhou 510610, China
Corresponding author. E-mail address: zhangangzhang@163.com
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Published:01 March 2019,
Published Online:14 February 2019,
Received:10 February 2018,
Revised:19 August 2018,
Accepted:21 August 2018
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Cite this article
Zhan-Gang Zhang, Yun Huang, Yun-Fei En, et al. Investigation of maximum proton energy for qualified ground-based evaluation of single event effects in SRAM devices. [J]. Nuclear Science and Techniques 30(3):47(2019)
Zhan-Gang Zhang, Yun Huang, Yun-Fei En, et al. Investigation of maximum proton energy for qualified ground-based evaluation of single event effects in SRAM devices. [J]. Nuclear Science and Techniques 30(3):47(2019) DOI: 10.1007/s41365-019-0570-x.
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