Zhan-Gang Zhang; Yun Huang; Yun-Fei En; Zhi-Feng Lei

doi:10.1007/s41365-019-0570-x

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Investigation of maximum proton energy for qualified ground-based evaluation of single event effects in SRAM devices

NUCLEAR ELECTRONICS AND INSTRUMENTATION | Updated：2021-02-01

- Investigation of maximum proton energy for qualified ground-based evaluation of single event effects in SRAM devices Cover Article Enhanced Publication
- Nuclear Science and Techniques Vol.30, Issue 3, (2019)
- Affiliations：
  
  Science and Technology on Reliability Physics and Application of Electronic Component Laboratory, China Electronic Product Reliability and Environmental Testing Research Institute,Guangzhou,China,510610
- Author bio：
- Funds：
- DOI：10.1007/s41365-019-0570-x CLC：
- Published：01 March 2019，
  
  Published Online：14 February 2019，
  
  Received：10 February 2018，
  
  Revised：19 August 2018，
  
  Accepted：21 August 2018
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Cite this article
Zhan-Gang Zhang, Yun Huang, Yun-Fei En, et al. Investigation of maximum proton energy for qualified ground-based evaluation of single event effects in SRAM devices. [J]. Nuclear Science and Techniques 30(3):47(2019)
DOI：

Zhan-Gang Zhang, Yun Huang, Yun-Fei En, et al. Investigation of maximum proton energy for qualified ground-based evaluation of single event effects in SRAM devices. [J]. Nuclear Science and Techniques 30(3):47(2019) DOI： 10.1007/s41365-019-0570-x.

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Investigation of maximum proton energy for qualified ground-based evaluation of single event effects in SRAM devices Cover Article Enhanced Publication