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Development of alpha surface contamination monitor based on THGEM for contamination distribution

NUCLEAR ELECTRONICS AND INSTRUMENTATION | Updated：2021-02-01

- Development of alpha surface contamination monitor based on THGEM for contamination distribution Cover Article Enhanced Publication
- Nuclear Science and Techniques Vol.30, Issue 10, (2019)
- Affiliations：
  
  China Institute of Atomic Energy,Beijing,China,100049;University of Chinese Academy of Sciences,Beijing,China,100049;CAS Key Laboratory of Vacuum Physics, UCAS,Beijing,China,100049
- Author bio：
- Funds：
- DOI：10.1007/s41365-019-0678-z CLC：
- Published：01 October 2019，
  
  Published Online：30 September 2019，
  
  Received：22 January 2019，
  
  Revised：18 April 2019，
  
  Accepted：05 May 2019
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Cite this article
Si-Min Xiao, Zhi-Ping Luo, Qian Liu, et al. Development of alpha surface contamination monitor based on THGEM for contamination distribution. [J]. Nuclear Science and Techniques 30(10):150(2019)
DOI：

Si-Min Xiao, Zhi-Ping Luo, Qian Liu, et al. Development of alpha surface contamination monitor based on THGEM for contamination distribution. [J]. Nuclear Science and Techniques 30(10):150(2019) DOI： 10.1007/s41365-019-0678-z.

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Development of alpha surface contamination monitor based on THGEM for contamination distribution Cover Article Enhanced Publication