Wei-Tao Yang; Qian Yin; Yang Li; Gang Guo; Yong-Hong Li; Chao-Hui He; Yan-Wen Zhang; Fu-Qiang Zhang; Jin-Hua Han

doi:10.1007/s41365-019-0672-5

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Single-event effects induced by medium-energy protons in 28 nm system-on-chip

ACCELERATOR, RAY TECHNOLOGY AND APPLICATIONS | 更新时间：2021-02-01

- Single-event effects induced by medium-energy protons in 28 nm system-on-chip 封面论文增强出版
- Single-event effects induced by medium-energy protons in 28 nm system-on-chip
- 核技术（英文版） 2019年 30卷第10期 (2019)
- 作者机构：
  
  School of Nuclear Science & Technology, Xi’an Jiaotong University,Xi’an,China,710049;National Innovation Center of Radiation Application, China Institute of Atomic Energy,Beijing,China,102413
- 作者简介：
- 基金信息：
  
  National Natural Science Foundation of China
- DOI：10.1007/s41365-019-0672-5 中图分类号：
- 纸质出版日期：2019-10-01，
  
  网络出版日期：2019-09-30，
  
  收稿日期：2019-03-26，
  
  修回日期：2019-05-10，
  
  录用日期：2019-05-18
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引用本文
Wei-Tao Yang, Qian Yin, Yang Li, 等. Single-event effects induced by medium-energy protons in 28 nm system-on-chip[J]. 核技术（英文版）, 2019, 30(10):151

Wei-Tao Yang, Qian Yin, Yang Li, et al. Single-event effects induced by medium-energy protons in 28 nm system-on-chip[J]. Nuclear Science and Techniques, 2019, 30(10):151
Wei-Tao Yang, Qian Yin, Yang Li, 等. Single-event effects induced by medium-energy protons in 28 nm system-on-chip[J]. 核技术（英文版）, 2019, 30(10):151 DOI： 10.1007/s41365-019-0672-5.

Wei-Tao Yang, Qian Yin, Yang Li, et al. Single-event effects induced by medium-energy protons in 28 nm system-on-chip[J]. Nuclear Science and Techniques, 2019, 30(10):151 DOI： 10.1007/s41365-019-0672-5.

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Single-event effects induced by medium-energy protons in 28 nm system-on-chip 封面论文 增强出版

Single-event effects induced by medium-energy protons in 28 nm system-on-chip 封面论文增强出版