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XPS STUDIES OF IRRADIATED HARD AND SOFT Si-SiO₂

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- XPS STUDIES OF IRRADIATED HARD AND SOFT Si-SiO₂ 封面论文增强出版
- XPS STUDIES OF IRRADIATED HARD AND SOFT Si-SiO₂
- 核技术（英文版） 1993年 4卷第3期 (1993)
- 作者机构：
  
  Xin jiang Institute of Physics, Academia Sinica,Urumqi,China,830011;Lishan Institute of Microelectronics, Aero-Space Industry Ministry,Xian,China,710600;Beijing Centre of Physical and Chemical Analysis,Beijing,China,100081
- 作者简介：
- 基金信息：
  
  Beijing Zhongguancun Associated Center of Analysis and Measurement()
- DOI：中图分类号：
- 纸质出版日期：1993-08-01，
  
  网络出版日期：，
  
  收稿日期：1992-12，
  
  修回日期：，
  
  录用日期：
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刘昶时, 赵元富, 王忠燕, 等. XPS STUDIES OF IRRADIATED HARD AND SOFT Si-SiO₂[J]. 核技术（英文版）, 1993, 4(3):181-185.

Changshi Liu, Yuanfu Zhao, Zhongyan Wang, et al. XPS STUDIES OF IRRADIATED HARD AND SOFT Si-SiO₂[J]. Nuclear Science and Techniques, 1993, 4(3):181-185.
刘昶时, 赵元富, 王忠燕, 等. XPS STUDIES OF IRRADIATED HARD AND SOFT Si-SiO₂[J]. 核技术（英文版）, 1993, 4(3):181-185. DOI：

Changshi Liu, Yuanfu Zhao, Zhongyan Wang, et al. XPS STUDIES OF IRRADIATED HARD AND SOFT Si-SiO₂[J]. Nuclear Science and Techniques, 1993, 4(3):181-185. DOI：

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XPS STUDIES OF IRRADIATED HARD AND SOFT Si-SiO2 封面论文 增强出版

XPS STUDIES OF IRRADIATED HARD AND SOFT Si-SiO₂ 封面论文增强出版