Your Location：

Home >

Browse articles >

Influence of scanning force microscope loading force on measurement of ion-track diameter

Updated：2021-02-05

- Influence of scanning force microscope loading force on measurement of ion-track diameter Cover Article Enhanced Publication
- Nuclear Science and Techniques Vol.8, Issue 3, (1997)
- Affiliations：
  
  Institute of Heavy Ion Physics, Peking University,Beijing,100871;Planckstr. 1,Darmstadt,Germany,D-64291
- Author bio：
- Funds：
- DOI： CLC：
- Published：01 August 1997，
  
  Published Online：，
  
  Received：20 March 1997，
  
  Revised：，
  
  Accepted：
Scan the full text
Cite this article
Yu-Gang Wang, Wei-Jiang Zhao, J Ackermann, et al. Influence of scanning force microscope loading force on measurement of ion-track diameter. [J]. Nuclear Science and Techniques 8(3):160-162(1997)
DOI：

Yu-Gang Wang, Wei-Jiang Zhao, J Ackermann, et al. Influence of scanning force microscope loading force on measurement of ion-track diameter. [J]. Nuclear Science and Techniques 8(3):160-162(1997) DOI：

0

Views

0

Downloads

0

CSCD

Alert me when the article has been cited

Submit

Tools

Publicity Resources

Related Articles

No data

Related Author

No data

Related Institution

No data

⁰