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Surface contamination of the charge-coupled device

Updated：2021-02-05

- Surface contamination of the charge-coupled device Cover Article Enhanced Publication
- Nuclear Science and Techniques Vol.12, Issue 2, (2001)
- Affiliations：
  
  Southwest Institute of Nuclear Physics and Chemistry,Mianyang,621900
- Author bio：
- Funds：
- DOI： CLC： O434.12, O472⁺.3, O484.4⁺1
- Published：01 May 2001，
  
  Published Online：，
  
  Received：12 June 2000，
  
  Revised：，
  
  Accepted：
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Jia-Min YANG, Yao-Nan DING, Zhi-Jian ZHENG, et al. Surface contamination of the charge-coupled device. [J]. Nuclear Science and Techniques 12(2):126-130(2001)
DOI：

Jia-Min YANG, Yao-Nan DING, Zhi-Jian ZHENG, et al. Surface contamination of the charge-coupled device. [J]. Nuclear Science and Techniques 12(2):126-130(2001) DOI：

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