无数据
官方微信
院刊强国号
Published:01 April 2018,
Published Online:13 March 2018,
Received:12 July 2017,
Revised:31 August 2017,
Accepted:17 September 2017
Scan the full text
Cite this article
Jing-Yan Xu, Shu-Ming Chen, Rui-Qiang Song, et al. Analysis of Single-Event Transient Sensitivity in Fully-Depleted Silicon-on-Insulator MOSFETs. [J]. Nuclear Science and Techniques 29(4):49(2018)
Jing-Yan Xu, Shu-Ming Chen, Rui-Qiang Song, et al. Analysis of Single-Event Transient Sensitivity in Fully-Depleted Silicon-on-Insulator MOSFETs. [J]. Nuclear Science and Techniques 29(4):49(2018) DOI: 10.1007/s41365-018-0391-3.
0
Views
0
Downloads
2
CSCD
Publicity Resources
Related Articles
Related Author
Related Institution