纸质出版日期:2018-04-01,
网络出版日期:2018-03-13,
收稿日期:2017-07-12,
修回日期:2017-08-31,
录用日期:2017-09-17
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Jing-Yan Xu, Shu-Ming Chen, Rui-Qiang Song, 等. Analysis of Single-Event Transient Sensitivity in Fully-Depleted Silicon-on-Insulator MOSFETs[J]. 核技术(英文版), 2018, 29(4):49
Jing-Yan Xu, Shu-Ming Chen, Rui-Qiang Song, et al. Analysis of Single-Event Transient Sensitivity in Fully-Depleted Silicon-on-Insulator MOSFETs[J]. Nuclear Science and Techniques, 2018, 29(4):49
Jing-Yan Xu, Shu-Ming Chen, Rui-Qiang Song, 等. Analysis of Single-Event Transient Sensitivity in Fully-Depleted Silicon-on-Insulator MOSFETs[J]. 核技术(英文版), 2018, 29(4):49 DOI: 10.1007/s41365-018-0391-3.
Jing-Yan Xu, Shu-Ming Chen, Rui-Qiang Song, et al. Analysis of Single-Event Transient Sensitivity in Fully-Depleted Silicon-on-Insulator MOSFETs[J]. Nuclear Science and Techniques, 2018, 29(4):49 DOI: 10.1007/s41365-018-0391-3.
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