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Experimental study on heavy ion single event effects in flash-based FPGAs

NUCLEAR ELECTRONICS AND INSTRUMENTATION | Updated：2021-02-23

- Experimental study on heavy ion single event effects in flash-based FPGAs Cover Article Enhanced Publication
- Nuclear Science and Techniques Vol.27, Issue 1, (2016)
- Affiliations：
  
  Institute of Modern Physics, Chinese Academy of Sciences,Lanzhou,China,730000;University of Chinese Academy of Sciences,Beijing,China,100049
- Author bio：
- Funds：
- DOI：10.1007/s41365-016-0015-8 CLC：
- Published：20 February 2016，
  
  Published Online：27 February 2016，
  
  Received：08 February 2015，
  
  Revised：19 August 2015，
  
  Accepted：09 September 2015
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Cite this article
Zhen-Lei YANG, Xiao-Hui WANG, Hong SU, et al. Experimental study on heavy ion single event effects in flash-based FPGAs. [J]. Nuclear Science and Techniques 27(1):7(2016)
DOI：

Zhen-Lei YANG, Xiao-Hui WANG, Hong SU, et al. Experimental study on heavy ion single event effects in flash-based FPGAs. [J]. Nuclear Science and Techniques 27(1):7(2016) DOI： 10.1007/s41365-016-0015-8.

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Experimental study on heavy ion single event effects in flash-based FPGAs Cover Article Enhanced Publication