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Prediction of proton induced SEE error rates for the VATA160 ASIC

NUCLEAR ELECTRONICS AND INSTRUMENTATION | Updated：2021-02-23

- Prediction of proton induced SEE error rates for the VATA160 ASIC Cover Article Enhanced Publication
- Nuclear Science and Techniques Vol.28, Issue 1, (2017)
- Affiliations：
  
  Institute of Modern Physics, Chinese Academy of Sciences,Lanzhou,China,730000;University of Chinese Academy of Sciences,Beijing,China,100049;State Key Laboratory of Particle Detection and Electronics, University of Science and Technology of China,Hefei,China,230026
- Author bio：
- Funds：
- DOI：10.1007/s41365-016-0153-z CLC：
- Published：01 January 2017，
  
  Published Online：01 December 2016，
  
  Received：16 November 2015，
  
  Revised：08 March 2016，
  
  Accepted：10 March 2016
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Cite this article
Kai Xi, Di Jiang, Shan-Shan Gao, et al. Prediction of proton induced SEE error rates for the VATA160 ASIC. [J]. Nuclear Science and Techniques 28(1):13(2017)
DOI：

Kai Xi, Di Jiang, Shan-Shan Gao, et al. Prediction of proton induced SEE error rates for the VATA160 ASIC. [J]. Nuclear Science and Techniques 28(1):13(2017) DOI： 10.1007/s41365-016-0153-z.

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Prediction of proton induced SEE error rates for the VATA160 ASIC Cover Article Enhanced Publication