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Identifying defect energy levels using DLTS under different electron irradiation conditions

NUCLEAR ENERGY SCIENCE AND ENGINEERING | Updated：2021-02-26

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- Identifying defect energy levels using DLTS under different electron irradiation conditions Cover Article Enhanced Publication
- Nuclear Science and Techniques Vol.28, Issue 12, (2017)
- Affiliations：
  
  College of Electronic Information and Control Engineering, Beijing University of Technology,Beijing,China,100124;Wuxi EL Pont Group,Wuxi,China,214151;Institute of High Energy Physics, Chinese Academy of Sciences,Beijing,China,100049
- Author bio：
- Funds：
- DOI：10.1007/s41365-017-0331-7 CLC：
- Published：01 December 2017，
  
  Published Online：28 November 2017，
  
  Received：01 November 2016，
  
  Revised：23 February 2017，
  
  Accepted：02 March 2017
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Cite this article
Chun-Sheng Guo, Ruo-Min Wang, Yu-Wei Zhang, et al. Identifying defect energy levels using DLTS under different electron irradiation conditions. [J]. Nuclear Science and Techniques 28(12):183(2017)
DOI：

Chun-Sheng Guo, Ruo-Min Wang, Yu-Wei Zhang, et al. Identifying defect energy levels using DLTS under different electron irradiation conditions. [J]. Nuclear Science and Techniques 28(12):183(2017) DOI： 10.1007/s41365-017-0331-7.

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