Scan system for arbitrary-shaped samples at the synchrotron radiation facility

Xu-Ying Lan; Dong-Xu Liang; Cheng-Wen Mao

doi:10.1007/s41365-017-0210-2

Your Location：

Home >

Browse articles >

Scan system for arbitrary-shaped samples at the synchrotron radiation facility

SYNCHROTRON RADIATION TECHNOLOGY AND APPLICATIONS | Updated：2021-02-23

- Scan system for arbitrary-shaped samples at the synchrotron radiation facility
- Nuclear Science and Techniques Vol. 28, Issue 5, Article number: 60(2017)
- Affiliations：
  
  1.Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Zhangjiang Campus, Shanghai 201204, China
- Author bio：
  
  Corresponding author. E-mail address: lanxuying@sinap.ac.cn
- Funds：
- DOI：10.1007/s41365-017-0210-2
  CLC：
Scan for full text
Xu-Ying Lan, Dong-Xu Liang, Cheng-Wen Mao. Scan system for arbitrary-shaped samples at the synchrotron radiation facility. [J]. Nuclear Science and Techniques 28(5):60(2017)
DOI：

Xu-Ying Lan, Dong-Xu Liang, Cheng-Wen Mao. Scan system for arbitrary-shaped samples at the synchrotron radiation facility. [J]. Nuclear Science and Techniques 28(5):60(2017) DOI： 10.1007/s41365-017-0210-2.

摘要

Abstract

XRF(X-ray fluorescence) scan methodology is important for elemental mapping of samples at a synchrotron radiation facility. To save the experiment time and improve the experiment efficiency, one should develop an efficient XRF scan method. In this paper, a new scan mode is presented. It can map arbitrary-shaped areas without stopping the motors. The control and data acquisition system integrates motor controlling, detector triggering, and data acquisition and storage. The system realizes the arbitrary-shaped 2D-mapping and fluorescence data acquisition synchronously. SR-XRF mapping has been performed with a standard gold mask to verify the validity of this method at beamline BL15U1 of the Shanghai Synchrotron Radiation Facility. The results show that this method reduces the total scan time and improves the experiment efficiency.

关键词

Keywords

Synchrotron radiationX-ray fluorescence mappingEPICSXPS controller

references

C.K. Bhat, D. Joseph, S. Pandita et al., Non-destructive analysis of didymium and praseodymium molybdate crystals using energy dispersive X-ray fluorescence technique. Radiat. Phys. Chem. 125, 9-13 (2016). doi: 10.1016/j.radphyschem.2016.02.028http://doi.org/10.1016/j.radphyschem.2016.02.028

M.L. Lord, F.E. McNeill, J.L. Grafe et al., A phantom-based feasibility study for detection of gadolinium in bone in-vivo using X-ray fluorescence. Appl. Radiat. Isot 112, 103-109 (2016). doi: 10.1016/j.apradiso.2016.03.021http://doi.org/10.1016/j.apradiso.2016.03.021

I. Ramos, I.M. Pataco, M.P. Mourinho et al., Elemental mapping of biofortified wheat grains using micro X-ray fluorescence. Spectrochim. Acta, Part B 120, 30-36 (2016). doi: 10.1016/j.sab.2016.03.014http://doi.org/10.1016/j.sab.2016.03.014

J.H. Dycus, W. Xu, X. Sang et al., Influence of experimental conditions on atom column visibility in energy dispersive X-ray spectroscopy. Ultramicroscopy 171, 1-7 (2016). doi: 10.1016/j.ultramic.2016.08.013http://doi.org/10.1016/j.ultramic.2016.08.013

M.A. Phedorin, V.A. Bobrov, K.V. Zolotarev, Peat archives from Siberia: Synchrotron beam scanning with X-ray fluorescence measurements. Nucl. Instrum. Methods Phys. Res., Sect. A 575, 199-201 (2007). doi: 10.1016/j.nima.2007.01.067http://doi.org/10.1016/j.nima.2007.01.067

K. Hayashi, N. Happo, S. Hosokawa, Applications of X-ray fluorescence holography to determine local lattice distortions. J. Electron. Spectrosc. Relat. Phenom. 195, 337-346 (2014). doi: 10.1016/j.elspec.2014.07.008http://doi.org/10.1016/j.elspec.2014.07.008

L. Lu, J.W. Huang, D. Fan et al., Anisotropic deformation of extruded magnesium alloy AZ31 under uniaxial compression:A study with simultaneous in situ synchrotron x-ray imaging and diffraction. Acta Mater, 120, 86-94 (2016). doi: 10.1016/j.actamat.2016.08.029http://doi.org/10.1016/j.actamat.2016.08.029

F. Yan, EPICS-based motion control and data acquisition system on synchrotron radiation microfocus station. Ph. D. Thesis, Shanghai: shanghai institute of applied physics, chinese academy of sciences, 2011.

P. Wrobel, M. Czyzycki, L. Furman et al., Labview control software for scanning micro-beam X-ray fluorescence spectrometer. Talanta 93, 186-192 (2012). doi: 10.1016/j.talanta.2012.02.010http://doi.org/10.1016/j.talanta.2012.02.010

F. Yan, J.C. Zhang, A.G. Li et al., Fast scanning X-ray microprobe fluorescence imaging based on synchrotron radiation. Acta. Phys.Sin. 60(9), 1-7 (2011). doi: 10.7498/aps.60.090702http://doi.org/10.7498/aps.60.090702

S. Stepanov, H. Mark, W.Y. Derek et al., Fast fluorescence techniques for crystallography beamlines. J. Appl. Crystallogr. 44, 772-778 (2011). doi: 10.1107/S0021889811016748http://doi.org/10.1107/S0021889811016748

Fast X-ray fluorescence imaging in continuous scanning mode at beamline L. http://hasyweb.desy.de/science/annual_reports/2005_report/part1/contrib/25/15448.pdfhttp://hasyweb.desy.de/science/annual_reports/2005_report/part1/contrib/25/15448.pdf

Pelz , M. Philipp, G. Sicairos et al., On-the-fly scans for X-ray ptychography. Appl. Phys. Lett. 105, 251101 (2014). doi: 10.1063/1.4904943http://doi.org/10.1063/1.4904943

F.X. Kartner, F. Ahr, A.L. Calendron et al., AXSIS: Exploring the frontiers in attosecond X-ray science, imaging and spectroscopy. Nucl. Instrum. Methods Phys. Res., Sect. A 829, 24-29 (2016). doi: 10.1016/j.nima.2016.02.080http://doi.org/10.1016/j.nima.2016.02.080

J.M. Sampaio, T.I. Madeira, M. Guerra et al., Relativistic calculations of K-,L- and M-shell x-ray production cross-sections by electron impact for Ne, Ar, Kr, Xe, Rn and Uuo. J. Quant. Spectrosc. Radiat. Transfer 182, 87-93 (2016). doi: 10.1016/j.jqsrt.2016.05.012http://doi.org/10.1016/j.jqsrt.2016.05.012

XPS Series Universal High-Performance Motion Controller/Driver. http://www.newport.com/XPS-Series-Motion-Controllers-Universal-High-Perf/300904/1033/info.aspxhttp://www.newport.com/XPS-Series-Motion-Controllers-Universal-High-Perf/300904/1033/info.aspx.

F. Yan, A.G. Li, K. Yang. EPICS-based data acquisition system of hard X-ray microfocus station. Nucl. Tech. 32(11), 801-805 (2009). doi: 10.7498/aps.60.090702http://doi.org/10.7498/aps.60.090702

L.L. Zhang, S. Yan, S. Jiang et al., Hard X-ray micro-focusing beamline at SSRF. Nucl. Sci. Tech. 26, 060101 (2015). doi: 10.13538/j.1001-8042/nst.26.060101http://doi.org/10.13538/j.1001-8042/nst.26.060101

T. Mooney.synApps:sscan.http://www.aps.anl.gov/bcda/synApps/sscan/sscan.htmlhttp://www.aps.anl.gov/bcda/synApps/sscan/sscan.html.

B. Franksen.State Notation Language and Sequencer. http://www-csr.bessy.de/control/SoftDist/sequencer/http://www-csr.bessy.de/control/SoftDist/sequencer/.

Views

Downloads

CSCD

Alert me when the article has been cited

Submit

Tools

Publicity Resources

Implementation of effective control system for variable-included angle plane-grating monochromator

Deep learning for estimation of Kirkpatrick–Baez mirror alignment errors

Commissioning and operation of the cryostat for 3W1 SC wiggler

Design and implementation of accelerator control monitoring system

Hard X-ray focusing resolution and efficiency test with a thickness correction multilayer Laue lens

Related Author

No data

Related Institution

Shanghai Institute of Applied Physics, Chinese Academy of Sciences

Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences

Shanghai Synchrotron Radiation Facility, Shanghai Advanced Research Institute, Chinese Academy of Sciences

ShanghaiTech University

University of Chinese Academy of Sciences

Address：Editorial Office of NST, 2019 Jialuo Road, Jiading, Shanghai 201800, China Postal code：201800
Email：nst@sinap.ac.cn
Technical support is provided by Beijing Founder electronics co., LTD 沪ICP备05005479号-1 京公网安备11010802024621
It is recommended to read the content of this site in Chrome&IE9+. Please switch to extreme mode in browser 360.
Cookies We use cookies to help provide and enhance our service and tailor content. By continuing, you agree to the use of cookies.

⁰