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Development of readout electronics for bunch arrival-time monitor system at SXFEL
- Nuclear Science and Techniques Vol. 30, Issue 5, Article number: 82(2019)
- Affiliations：
1.Shanghai Institute of Applied Physics, Chinese Academy of Science, Shanghai 201204, China
2.University of the Chinese Academy of Science, Beijing 100049, China
- Author bio：
Corresponding author. E-mail: liubo@sinap.ac.cn
- Funds：
DOI：10.1007/s41365-019-0594-2
CLC：
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Jin-Guo Wang, Bo Liu. Development of readout electronics for bunch arrival-time monitor system at SXFEL. [J]. Nuclear Science and Techniques 30(5):82(2019)
Jin-Guo Wang, Bo Liu. Development of readout electronics for bunch arrival-time monitor system at SXFEL. [J]. Nuclear Science and Techniques 30(5):82(2019) DOI： 10.1007/s41365-019-0594-2.
摘要
Abstract
A bunch arrival-time monitor (BAM) system, based on electro-optical intensity modulation scheme, is under study at Shanghai soft X-ray Free Electron Laser (SXFEL). The aim of the study is to achieve high-precision time measurement for minimizing bunch fluctuations. A readout electronics is developed to fulfill the requirements of the BAM system. The readout electronics is mainly composed of a signal conditioning circuit, Field-Programmable Gate Array (FPGA), Mezzanine Card (FMC150), and powerful FPGA carrier board. The signal conditioning circuit converts the laser pulses into electrical pulse signals using a photodiode. Thereafter, it performs splitting and low noise amplification to achieve the best voltage sampling performance of the dual channel Analog-to-Digital Converter (ADC) in FMC150. The FMC150 ADC daughter card includes a 14-bit 250 Msps dual channel high-speed ADC, a clock configuration, and a management module. The powerful FPGA carrier board is a commercial high-performance Xilinx Kintex-7 FPGA evaluation board. To achieve clock and data alignment for ADC data capture at a high sampling rate, we used ISERDES, IDELAY, and dedicated carry-in resources in the Kintex-7 FPGA. This paper presents a detailed development of the readout electronics in the BAM system and its implementation performance.
关键词
Keywords
Bunch Arrival-time Monitor (BAM)Shanghai soft X-ray Free Electron Laser (SXFEL)Field-Programmable Gate Array (FPGA)Signal conditioningHigh-speed Analog-to-Digital Converter (ADC)
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