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Machine learning-based analyses for total ionizing dose effects in bipolar junction transistors
NUCLEAR ELECTRONICS AND INSTRUMENTATION | Updated:2022-11-22
    • Machine learning-based analyses for total ionizing dose effects in bipolar junction transistors

    • Nuclear Science and Techniques   Vol. 33, Issue 10, Article number: 131(2022)
    • DOI:10.1007/s41365-022-01107-w    

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  • Bai-Chuan Wang, Meng-Tong Qiu, Wei Chen, et al. Machine learning-based analyses for total ionizing dose effects in bipolar junction transistors. [J]. Nuclear Science and Techniques 33(10):131(2022) DOI: 10.1007/s41365-022-01107-w.

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