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1.Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou 730000, China
2.School of Nuclear Science and Technology, University of Chinese Academy of Sciences, Beijing 100049, China
3.School of Nuclear Science and Technology, Lanzhou University, Lanzhou 730000, China
shwzeng@impcas.ac.cn
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Published:2022-10,
Published Online:15 October 2022,
Received:25 March 2022,
Revised:24 July 2022,
Accepted:21 August 2022
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Cite this article
Jie Wang, Da-Qing Gao, Wan-Zeng Shen, et al. Lifetime estimation of IGBT module using square-wave loss discretization and power cycling test. [J]. Nuclear Science and Techniques 33(10):133(2022)
Jie Wang, Da-Qing Gao, Wan-Zeng Shen, et al. Lifetime estimation of IGBT module using square-wave loss discretization and power cycling test. [J]. Nuclear Science and Techniques 33(10):133(2022) DOI: 10.1007/s41365-022-01118-7.
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