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Lifetime estimation of IGBT module using square-wave loss discretization and power cycling test
NUCLEAR ELECTRONICS AND INSTRUMENTATION | Updated:2022-11-22
    • Lifetime estimation of IGBT module using square-wave loss discretization and power cycling test

    • Nuclear Science and Techniques   Vol. 33, Issue 10, Article number: 133(2022)
    • DOI:10.1007/s41365-022-01118-7    

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  • Jie Wang, Da-Qing Gao, Wan-Zeng Shen, et al. Lifetime estimation of IGBT module using square-wave loss discretization and power cycling test. [J]. Nuclear Science and Techniques 33(10):133(2022) DOI: 10.1007/s41365-022-01118-7.

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