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X-band deflecting cavity design for ultra-short bunch length measurement of SXFEL at SINAP
SYNCHROTRON RADIATION TECHNOLOGY AND APPLICATIONS | Updated:2021-01-20
    • X-band deflecting cavity design for ultra-short bunch length measurement of SXFEL at SINAP

    • Nuclear Science and Techniques   Vol. 25, Issue 6, Article number: 060101(2014)
    • DOI:10.13538/j.1001-8042/nst.25.060101    

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  • Jian-Hao TAN, Qiang GU, Wen-Cheng FANG, et al. X-band deflecting cavity design for ultra-short bunch length measurement of SXFEL at SINAP. [J]. Nuclear Science and Techniques 25(6):060101(2014) DOI: 10.13538/j.1001-8042/nst.25.060101.

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