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Signal modeling and impulse response shaping for semiconductor detectors

NUCLEAR ELECTRONICS AND INSTRUMENTATION | Updated：2022-12-16

- Signal modeling and impulse response shaping for semiconductor detectors Cover Article Enhanced Publication
- Nuclear Science and Techniques Vol.33, Issue 4, (2022)
- Affiliations：
  
  College of Nuclear Technology and Automation Engineering, Chengdu University of Technology, No. 1 East 3 Road, Erxian Bridge, Chenghua District,Chengdu,China,610059;Jiangxi Engineering Technology Research Center of Nuclear Geoscience Data Science and System, East China University of Technology,Nanchang,China,330013;China Testing Technology Co., Ltd.,Chengdu,China,610021
- Author bio：
- Funds：
- DOI：10.1007/s41365-022-01027-9 CLC：
- Published：2022-04，
  
  Published Online：20 April 2022，
  
  Received：14 December 2021，
  
  Revised：28 February 2022，
  
  Accepted：03 March 2022
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Cite this article
Xue-Yuan Wang, Jian-Bin Zhou, Ming Wang, et al. Signal modeling and impulse response shaping for semiconductor detectors. [J]. Nuclear Science and Techniques 33(4):46(2022)
DOI：

Xue-Yuan Wang, Jian-Bin Zhou, Ming Wang, et al. Signal modeling and impulse response shaping for semiconductor detectors. [J]. Nuclear Science and Techniques 33(4):46(2022) DOI： 10.1007/s41365-022-01027-9.

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