无数据
官方微信
院刊强国号
Published:20 December 2014,
Published Online:06 December 2014,
Received:20 June 2013,
Revised:,
Accepted:27 August 2014
Scan the full text
Cite this article
Jian-Hao TAN, Qiang GU, Wen-Cheng FANG, et al. X-band deflecting cavity design for ultra-short bunch length measurement of SXFEL at SINAP. [J]. Nuclear Science and Techniques 25(6):060101(2014)
Jian-Hao TAN, Qiang GU, Wen-Cheng FANG, et al. X-band deflecting cavity design for ultra-short bunch length measurement of SXFEL at SINAP. [J]. Nuclear Science and Techniques 25(6):060101(2014) DOI: 10.13538/j.1001-8042/nst.25.060101.
0
Views
0
Downloads
0
Cited
Publicity Resources
Related Articles
Related Author
Related Institution