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X-band deflecting cavity design for ultra-short bunch length measurement of SXFEL at SINAP

SYNCHROTRON RADIATION TECHNOLOGY AND APPLICATIONS | Updated：2021-01-20

- X-band deflecting cavity design for ultra-short bunch length measurement of SXFEL at SINAP Cover Article Enhanced Publication
- Nuclear Science and Techniques Vol.25, Issue 6, (2014)
- Affiliations：
  
  Shanghai Institute of Applied Physics, Chinese Academy of Sciences,Shanghai,China,201800;University of Chinese Academy of Sciences,Beijing,China,100049;Department of Engineering Physics, Tsinghua University,Beijing,China,100084;Shanghai Key Laboratory of Cryogenics & Superconducting RF Technology,Shanghai,China,201800
- Author bio：
- Funds：
- DOI：10.13538/j.1001-8042/nst.25.060101 CLC：
- Published：20 December 2014，
  
  Published Online：06 December 2014，
  
  Received：20 June 2013，
  
  Revised：，
  
  Accepted：27 August 2014
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Cite this article
Jian-Hao TAN, Qiang GU, Wen-Cheng FANG, et al. X-band deflecting cavity design for ultra-short bunch length measurement of SXFEL at SINAP. [J]. Nuclear Science and Techniques 25(6):060101(2014)
DOI：

Jian-Hao TAN, Qiang GU, Wen-Cheng FANG, et al. X-band deflecting cavity design for ultra-short bunch length measurement of SXFEL at SINAP. [J]. Nuclear Science and Techniques 25(6):060101(2014) DOI： 10.13538/j.1001-8042/nst.25.060101.

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X-band deflecting cavity design for ultra-short bunch length measurement of SXFEL at SINAP Cover Article Enhanced Publication