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Principle of diffraction enhanced imaging (DEI) and computed tomography based on DEI method

SYNCHROTRON TECHNOLOGY AND APPLICATIONS | Updated：2021-01-29

- Principle of diffraction enhanced imaging (DEI) and computed tomography based on DEI method Cover Article Enhanced Publication
- Nuclear Science and Techniques Vol.17, Issue 6, (2006)
- Affiliations：
  
  Beijing Synchrotron Radiation Facility, Institute of High Energy Physics, Chinese Academy of Sciences,Beijing,China,100049;Electronic Institute of Dalian University of Technology,Dalian,China,116023
- Author bio：
- Funds：
- DOI：10.1016/S1001-8042(07)60004-9 CLC： O434.14,TH774
- Published：20 December 2006，
  
  Published Online：，
  
  Received：，
  
  Revised：，
  
  Accepted：
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Cite this article
Pei-Ping ZHU, Wan-Xia HUANG, Qing-Xi YUAN, et al. Principle of diffraction enhanced imaging (DEI) and computed tomography based on DEI method. [J]. Nuclear Science and Techniques 17(6):342-353(2006)
DOI：

Pei-Ping ZHU, Wan-Xia HUANG, Qing-Xi YUAN, et al. Principle of diffraction enhanced imaging (DEI) and computed tomography based on DEI method. [J]. Nuclear Science and Techniques 17(6):342-353(2006) DOI： 10.1016/S1001-8042(07)60004-9.

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Principle of diffraction enhanced imaging (DEI) and computed tomography based on DEI method Cover Article Enhanced Publication