Sulfonated polyetherketone (SPEK-C) films investigated by positron annihilation lifetime spectroscopy and atomic force microscopy

Htwe Htwe Yin; Ze-Jie YIN; Shi-Biao TANG; Huan HUANG; Da-Ming ZHU

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Sulfonated polyetherketone (SPEK-C) films investigated by positron annihilation lifetime spectroscopy and atomic force microscopy

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- Sulfonated polyetherketone (SPEK-C) films investigated by positron annihilation lifetime spectroscopy and atomic force microscopy
- Nuclear Science and Techniques Vol. 16, Issue 6, (2005)
- Affiliations：
  
  1.Department of Modern Physics, University of Science and Technology of China, Hefei 230026, China;
  2.Department of Physics, University of Missouri-Kansas City, Kansas City, Missouri 64110, USA
- Author bio：
  
  Corresponding author. Nationality is Myanmar.
  
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- Funds：
- DOI： CLC： O63,O571.3,TH742
- Published：01 December 2005，
  
  Received：22 March 2005，
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Htwe Htwe Yin, Ze-Jie YIN, Shi-Biao TANG, et al. Sulfonated polyetherketone (SPEK-C) films investigated by positron annihilation lifetime spectroscopy and atomic force microscopy. [J]. Nuclear Science and Techniques 16(6):341-346(2005)
DOI：

Htwe Htwe Yin, Ze-Jie YIN, Shi-Biao TANG, et al. Sulfonated polyetherketone (SPEK-C) films investigated by positron annihilation lifetime spectroscopy and atomic force microscopy. [J]. Nuclear Science and Techniques 16(6):341-346(2005) DOI：

Sulfonated polyetherketone (SPEK-C) films investigated by positron annihilation lifetime spectroscopy and atomic force microscopy 1 corresp first-author Corresponding author. Nationality is Myanmar. Corresponding author. Nationality is Myanmar. 1 1 1 2 Department of Modern Physics, University of Science and Technology of China, Hefei 230026, China; Department of Modern Physics, University of Science and Technology of China, Hefei 230026, China; Department of Physics, University of Missouri-Kansas City, Kansas City, Missouri 64110, USA Department of Physics, University of Missouri-Kansas City, Kansas City, Missouri 64110, USA The characterization of sulfonated polyetherketone (SPEK-C) films was investigated by using positron annihilation lifetime spectroscopy (PALS) and atomic force microscopy (AFM). It was found that free volume radius and intensity depend on the variation of sulfonation degree and solvent evaporation time of the films. Pore size and distribution determined from PALS and AFM measurements showed reasonable agreement. Atomic force microscopy (AFM) Sulfonated polyetherketone (SPEK-C) Sulfonation degree Positron lifetime Free volume Pore size References Jean Y C , NATO Advanced Research Workshop , 1993 : 563 - 580 NATO Advanced Research Workshop Dlubek G , Stejny J , Lupke T H , et al . J Polym Sci , 2002 , B40 : 65 - 81 J Polym Sci Binnig G , Quate C F , Gerber C . Phys Rev Lett , 1986 , 56 : 930 Phys Rev Lett Kim J Y , Lee H K , Kim S C . J Membr Sci , 1999 , 163 : 159 - 166 J Membr Sci Trotta F , Drioli E , Moraglio G , et al . J Appl Polym Sci , 1998 , 70 : 477 J Appl Polym Sci Colquhoun H M , Lewis D F , Herbertson P L , et al . Polymer , 1997 , 38 : 4539 Polymer Jia L D , Xu X F , Zhang H J , et al . J Appl Polym Sci , 1996 , 60 : 1231 J Appl Polym Sci Hu K , Xu T W , Fu Y X , et al . J Appl Polym Sci , 2004 , 92 : 1478 J Appl Polym Sci Kirkegaard P , Pedersen N J , Eldrup M . PATFIT-88 . Risoe National Laboratory , Roskilde, Denmark , 1989 . PATFIT-88 Tao S J . J Chem Phys , 1972 , 56 : 5499 J Chem Phys Eldrup M , Lightbody D , Sherwood J N . Chem Phys , 1981 , 63 : 51 Chem Phys Nakanishi H , Wang S J , Jean Y C . In Positron annihilation studies of fluids , Sharma S C , (Ed.) Singapore : World Science , 1988 : 292 In Positron annihilation studies of fluids Wang Y Y , Nakanishi H , Jean Y C , et al . J Polym Sci , 1990 , B28 : 1431 J Polym Sci PSIA Corp ., Available from: http://www.psia.co.kr O63,O571.3,TH742 Supported by "Hundred People Plan Fund" of CAS 2005-03-22 2005-12-01 2021-01-19 2005 Nuclear Science and Techniques 06 16

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