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A flexible and robust soft-error testing system for microelectronic devices and integrated circuits

NUCLEAR ELECTRONICS AND INSTRUMENTATION | Updated：2021-01-20

- A flexible and robust soft-error testing system for microelectronic devices and integrated circuits Cover Article Enhanced Publication
- Nuclear Science and Techniques Vol.26, Issue 3, (2015)
- Affiliations：
  
  Institute of Modern Physics, Chinese Academy of Sciences,Lanzhou,China,730000;University of Chinese Academy of Sciences,Beijing,China,100049
- Author bio：
- Funds：
- DOI：10.13538/j.1001-8042/nst.26.030401 CLC：
- Published：20 June 2015，
  
  Published Online：20 June 2015，
  
  Received：15 August 2014，
  
  Revised：，
  
  Accepted：23 September 2014
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Cite this article
Xiao-Hui WANG, Teng TONG, Hong SU, et al. A flexible and robust soft-error testing system for microelectronic devices and integrated circuits. [J]. Nuclear Science and Techniques 26(3):030401(2015)
DOI：

Xiao-Hui WANG, Teng TONG, Hong SU, et al. A flexible and robust soft-error testing system for microelectronic devices and integrated circuits. [J]. Nuclear Science and Techniques 26(3):030401(2015) DOI： 10.13538/j.1001-8042/nst.26.030401.

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A flexible and robust soft-error testing system for microelectronic devices and integrated circuits Cover Article Enhanced Publication