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1.Key Laboratory of Opto-electronics Technology & System, Ministry of Education, Chongqing University, Chongqing 400044, China
Corresponding author, coe-fp@cqu.edu.cn
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Published:20 August 2015,
Published Online:20 August 2015,
Received:30 July 2014,
Accepted:13 October 2014
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Cite this article
Peng FENG, Biao WEI, Jing JIN. Parallel and optimized genetic Elman network for 252Cf source-driven verification system. [J]. Nuclear Science and Techniques 26(4):040404(2015)
Peng FENG, Biao WEI, Jing JIN. Parallel and optimized genetic Elman network for 252Cf source-driven verification system. [J]. Nuclear Science and Techniques 26(4):040404(2015) DOI: 10.13538/j.1001-8042/nst.26.040404.
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