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DEPTH PROFILING OF ¹H AND/OR ⁴He IN SOLIDS BY ERD WITH ¹⁹F IONS

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- DEPTH PROFILING OF ¹H AND/OR ⁴He IN SOLIDS BY ERD WITH ¹⁹F IONS Cover Article Enhanced Publication
- Nuclear Science and Techniques Vol.1, Issue 1-2, (1990)
- Affiliations：
  
  Institute of Physics, Academia Sinica,Beijing,China,100080;Central Institute of Nationality,Beijing,China,100081
- Author bio：
- Funds：
- DOI： CLC：
- Published：01 May 1990，
  
  Published Online：，
  
  Received：1989-11，
  
  Revised：，
  
  Accepted：
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Peiran Zhu, Jiarui Liu, Mengmei Ren, et al. DEPTH PROFILING OF ¹H AND/OR ⁴He IN SOLIDS BY ERD WITH ¹⁹F IONS. [J]. Nuclear Science and Techniques 1(1-2):65-69(1990)
DOI：

Peiran Zhu, Jiarui Liu, Mengmei Ren, et al. DEPTH PROFILING OF ¹H AND/OR ⁴He IN SOLIDS BY ERD WITH ¹⁹F IONS. [J]. Nuclear Science and Techniques 1(1-2):65-69(1990) DOI：

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