Influence of scanning force microscope loading force on measurement of ion-track diameter

Influence of scanning force microscope loading force on measurement of ion-track diameter 1 first-author 1 2 2 2 Institute of Heavy Ion Physics, Peking University, Beijing 100871 Institute of Heavy Ion Physics, Peking University, Beijing 100871 Gesellschaft für Schwerionenforschung (GSI) , Planckstr. 1, D-64291 Darmstadt, Germany Gesellschaft für Schwerionenforschung (GSI) , Planckstr. 1, D-64291 Darmstadt, Germany Scanning force microscope (SFM) was operated in the lateral-force mode with different loading forces. The mica samples were irradiated by Se ions with a kinetic energy of 11.4 MeV/u. The "full-height width" and the "half-height width" of track profiles were used to evaluate the ion-track diameter. For the former method, the average track diameter increases slowly with increasing loading force between SFM tip and sample. For the later method, the average diameters of ion track nearly keep a common value as the SFM loading force increases. Ion-track diameter Scanning force microscopy loading force References Thibaudan F , Cousty J , Balanzat E et al . Phys Rev Lett , 1991 ; 67 : 1582 Phys Rev Lett Ackermann J , Angert N , Neumann R et al . Nucl Instr Meth , 1996 ; B107 : 181 Nucl Instr Meth Heuberger M , Dictlcr G , Schlapbach L . Private communication Private communication The work was funded by GSI, Germany 1997-03-20 1997-08-01 2021-02-05 1997 Nuclear Science and Techniques 3 8