Bao-Yuan Man; Ai-Hua Liu; Xiang-Tai Wang

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Analysis of surface damage produced by pulsed laser ablation on metal Al and semiconductor Si

更新时间：2021-02-05

- Analysis of surface damage produced by pulsed laser ablation on metal Al and semiconductor Si 封面论文增强出版
- Analysis of surface damage produced by pulsed laser ablation on metal Al and semiconductor Si
- 核技术（英文版） 1998年 9卷第2期 (1998)
- 作者机构：
  
  Department of Physics, Shandong Normal University,Jinan,China,250014
- 作者简介：
- 基金信息：
- DOI：中图分类号：
- 纸质出版日期：1998-05-01，
  
  网络出版日期：，
  
  收稿日期：1997-11-03，
  
  修回日期：，
  
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Bao-Yuan Man, Ai-Hua Liu, Xiang-Tai Wang. Analysis of surface damage produced by pulsed laser ablation on metal Al and semiconductor Si[J]. 核技术（英文版）, 1998, 9(2):98-101.

Bao-Yuan Man, Ai-Hua Liu, Xiang-Tai Wang. Analysis of surface damage produced by pulsed laser ablation on metal Al and semiconductor Si[J]. Nuclear Science and Techniques, 1998, 9(2):98-101.
Bao-Yuan Man, Ai-Hua Liu, Xiang-Tai Wang. Analysis of surface damage produced by pulsed laser ablation on metal Al and semiconductor Si[J]. 核技术（英文版）, 1998, 9(2):98-101. DOI：

Bao-Yuan Man, Ai-Hua Liu, Xiang-Tai Wang. Analysis of surface damage produced by pulsed laser ablation on metal Al and semiconductor Si[J]. Nuclear Science and Techniques, 1998, 9(2):98-101. DOI：

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Analysis of surface damage produced by pulsed laser ablation on metal Al and semiconductor Si 封面论文 增强出版

Analysis of surface damage produced by pulsed laser ablation on metal Al and semiconductor Si 封面论文增强出版