Chun-Sheng Guo; Ruo-Min Wang; Yu-Wei Zhang; Guo-Xi Pei; Shi-Wei Feng; Zhao-Xian Li

doi:10.1007/s41365-017-0331-7

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Identifying defect energy levels using DLTS under different electron irradiation conditions

NUCLEAR ENERGY SCIENCE AND ENGINEERING | 更新时间：2021-02-26

- Identifying defect energy levels using DLTS under different electron irradiation conditions 封面论文增强出版
- Identifying defect energy levels using DLTS under different electron irradiation conditions
- Nuclear Science and Techniques 2017年 28卷第12期 (2017)
- 作者机构：
  
  College of Electronic Information and Control Engineering, Beijing University of Technology,Beijing,China,100124;Wuxi EL Pont Group,Wuxi,China,214151;Institute of High Energy Physics, Chinese Academy of Sciences,Beijing,China,100049
- 作者简介：
- 基金信息：
  
  Beijing education and scientific research department(KM201510005008)
- DOI：10.1007/s41365-017-0331-7 中图分类号：
- 纸质出版日期：2017-12-01，
  
  网络出版日期：2017-11-28，
  
  收稿日期：2016-11-01，
  
  修回日期：2017-02-23，
  
  录用日期：2017-03-02
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Chun-Sheng Guo, Ruo-Min Wang, Yu-Wei Zhang, 等. Identifying defect energy levels using DLTS under different electron irradiation conditions[J]. Nuclear Science and Techniques, 2017, 28(12):183

Chun-Sheng Guo, Ruo-Min Wang, Yu-Wei Zhang, et al. Identifying defect energy levels using DLTS under different electron irradiation conditions[J]. Nuclear Science and Techniques, 2017, 28(12):183
Chun-Sheng Guo, Ruo-Min Wang, Yu-Wei Zhang, 等. Identifying defect energy levels using DLTS under different electron irradiation conditions[J]. Nuclear Science and Techniques, 2017, 28(12):183 DOI： 10.1007/s41365-017-0331-7.

Chun-Sheng Guo, Ruo-Min Wang, Yu-Wei Zhang, et al. Identifying defect energy levels using DLTS under different electron irradiation conditions[J]. Nuclear Science and Techniques, 2017, 28(12):183 DOI： 10.1007/s41365-017-0331-7.

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Identifying defect energy levels using DLTS under different electron irradiation conditions 封面论文 增强出版

Identifying defect energy levels using DLTS under different electron irradiation conditions 封面论文增强出版