a.Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai 201800, China
b.Shanghai Synchrotron Radiation Facility (SSRF), Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai 201204, China
Corresponding authors, xiehonglan@sinap.ac.cn;
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纸质出版日期:2020-10-01,
网络出版日期:2020-10-11,
收稿日期:2020-06-12,
修回日期:2020-08-02,
录用日期:2020-08-06
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引用本文
Hong-Lan Xie, Biao Deng, Guo-Hao Du, 等. Methodology development and application of X-ray imaging beamline at SSRF[J]. 核技术(英文版), 2020, 31(10):102
Hong-Lan Xie, Biao Deng, Guo-Hao Du, et al. Methodology development and application of X-ray imaging beamline at SSRF[J]. Nuclear Science and Techniques, 2020, 31(10):102
Hong-Lan Xie, Biao Deng, Guo-Hao Du, 等. Methodology development and application of X-ray imaging beamline at SSRF[J]. 核技术(英文版), 2020, 31(10):102 DOI: 10.1007/s41365-020-00805-7.
Hong-Lan Xie, Biao Deng, Guo-Hao Du, et al. Methodology development and application of X-ray imaging beamline at SSRF[J]. Nuclear Science and Techniques, 2020, 31(10):102 DOI: 10.1007/s41365-020-00805-7.
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