X-ray scattering from liquid interfaces

SYNCHROTRON TECHNOLOGY AND APPLICATIONS

X-ray scattering from liquid interfaces

LI Ming，

Mark L. SCHLOSSMAN

Nuclear Science and Techniques

Vol.17, No.6

pp.322-333

Published in print 20 Dec 2006

DOI：10.1016/S1001-8042(07)60002-5

CLC：O434.1,O436.2,O647.11

34101

Synchrotron radiation X-ray scattering is a useful tool for structural characterization of liquid interfaces. Specular reflectivity provides precise measurement of the interfacial widths and of the ordering of surfactants adsorbed to these interfaces. Diffuse scattering gives information on phase transitions and domain formation in surfactant monolayers and on interfacial fluctuations confined by and coupled across fluidic films.

Liquid interfacesX-ray scatteringSynchrotron radiation

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