RADIATION DAMAGES OF PHOTODEVICE AND ITS SUBSTRATE MATERIAL

Li Shiqing，

Zhang Nengli

Nuclear Science and Techniques

pp.42-44

Published in print 01 Feb 1993

40500

γ-radiation damage study of photodevice and its substrate shows that γ-radiation makes the light current, current amplification factor and respond time of devices decreased, dark current increased, but junction capacitance unchanged basicly. The resistivity of substrate was slowly increased. The analysis of positron annihilation lifetime spectra demonstrated that the second lifetime component τ₂ was reduced, but the corresponding intensity I₂ raised. Those indicate the macroscopic and microscopic changes in substrate after γ-irradiation.

IrradiationPhotodevicePositron annihilation

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