A PROGRAM FOR QUANTITATIVE PIXE ANALYSIS OF THICK SAMPLE

Dai Zhongning，

Ren Chigang，

Liu Nianqing

Nuclear Science and Techniques

Vol.4, No.4

pp.209-212

Published in print 01 Nov 1993

37600

A program for quantitative PIXE analysis of thick sample (TSPIXE) without reference material has been developed at Fudan University. Our program can be applied to the energy range of 10 keV to 10 MeV and is suitable for the analysis of all elements with 11 < Z < 92. NBS reference materials were analyzed to provide the experimental test of TSPIXE program.

Thick samplePIXE analysisTSPIXE

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