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Operando measurement of lattice deformation profiles of synchrotron radiation monochromator

ACCELERATOR, RAY TECHNOLOGY AND APPLICATIONS

Operando measurement of lattice deformation profiles of synchrotron radiation monochromator

Yue Zhang
Zhong-Liang Li
Shang-Yu Si
Lian Xue
Hong-Xin Luo
Xiao-Wei Zhang
Jun Hu
Nuclear Science and TechniquesVol.35, No.7Article number 110Published in print Jul 2024Available online 08 Jul 2024
504020

This study presents a new method for characterizing the thermal lattice deformation of a monochromator with high precision under service conditions and first reports the operando measurements of nanoscale thermal lattice deformation on a double-crystal monochromator at different incident powers. The nanoscale thermal lattice deformation of the monochromator first crystal was obtained by analyzing the intensity of the distorted DuMond diagrams. DuMond diagrams of the 333 diffraction index, sensitive to lattice deformation, were obtained directly using a 2D detector and an analyzer crystal orthogonal to the monochromator. With increasing incident power and power density, the maximum height of the lattice deformation increased from 3.2 nm to 18.5 nm, and the deformation coefficient of the maximum height increased from 1.1 nm/W to 3.2 nm/W. The maximum relative standard deviation was 4.2%, and the maximum standard deviation was 0.1 nm. Based on the measured thermal deformations, the flux saturation phenomenon and critical point for the linear operation of the monochromator were predicted with increasing incident power. This study provides a simple solution to the problem of the lower precision of synchrotron radiation monochromator characterizations compared to simulations.

Synchrotron radiationMonochromatorLattice deformationX-ray dynamic diffraction
1

Introduction

As a crucial device for synchrotron radiation (SR) beamlines, the double-crystal monochromator (DCM) is a complex and precise optical system with multiple integrated factors [1-3]. The transmission performance of DCM depends closely on the thermophysical properties of the crystal and the thermal treatment technology [4-6]. The first aspect involves the coefficients of thermal expansion and thermal conductivity of the crystal, and the second is related to clamping, cooling, and deformation correction technologies for crystals. The performance of a monochromator is susceptible to thermal deformation; thus, the cooling technology is tightly linked to the performance improvement of the monochromator.

The design of crystal cooling schemes relies on finite element analysis (FEA). With the development of computer technology, the thermal analysis of Synchrotron Radiation monochromators has reached a higher level than experimental measurements of thermal deformation [7-10]. A common method for measuring the thermal deformation is to obtain the surface slope error using the difference between the full width at half maximum (FWHM) of the measured and theoretical rocking curves [11, 12]. It is simple and easy to implement; however, the FWHM of the rocking curve is a convolution of multiple factors, such as thermal deformation, bandwidth, angular divergence, and detection system, and cannot be directly deconvoluted to obtain the thermal deformation without loss of details. Other synchrotron radiation light source facilities have developed new measurement methods [13, 14], where the resolution is limited by the amount of data, or processing is difficult. In addition to direct deformation measurements, the temperature field can indirectly determine thermal deformation. However, conventional temperature sensors, such as thermocouples and thermal resistance sensors, fail in strong radiation environments. Infrared radiation thermometers can measure the temperature distributions on the surfaces of common objects, excluding silicon material, as it is transparent to the infrared band [15]. In addition, the resolution of infrared radiation thermometers fails to meet the requirements for characterizing crystal thermal deformation.

For an ideal working monochromator, the excellent initial lattice flatness of the first crystal should be maintained under high-power beam irradiation to match the lattice plane of the second crystal perfectly. Scientists at synchrotron radiation facilities have systematically studied the crystal materials, cooling structures, and coolants to achieve this goal [16-20]. Some crystal cooling techniques, such as the cryogenic cooling of liquid nitrogen, have positively suppressed crystal surface deformation. This method is employed in almost all third-generation synchrotron radiation facilities [4, 11, 21, 22]. These studies effectively addressed the basic survival problem of DCM in commission under high heat loads and made many experiments achievable with high-power synchrotron radiation [23, 24].

However, as mentioned above, in the design process of cooling systems, characterization of the DCM lags behind computer simulations in terms of precision. This implies that FEA results were validated experimentally only to a certain extent. In the absence of high-resolution, real-time feedback, the simulation is detached from the real surface of the operating crystal, which changes owing to vibrations, operating hours, and adjustments of other conditions during operation. In other words, the cooling solutions provided by current computer simulations may not be optimal, and existing experimental methods provide no valid feedback. The actual operation poses the possibility of uneven cooling owing to the distribution of coolant channels and the possibility of undercooling in some cases and overcooling in others, attributed to a fixed cooling temperature. Although these effects may not be apparent at present, the progressively severe working conditions of monochromators, driven by advancements in advanced light sources and increasing beam power density, underscore the need for continual improvements in cooling schemes. High-resolution, real-time measurements are crucial in enhancing the performance [25, 26].

Recently, we proposed a method to simply and effectively address the challenges in high-resolution and high-efficiency characterization of monochromators. Using an orthogonal analyzer crystal and a 2D detector, the angular divergence and energy bandwidth of the SR beam can be decoupled [27]. This decoupling allows the DuMond diagram to transition from phase space to real space. In this study, we used a Si(333) analyzer crystal to measure the DuMond diagram of DCM under varying incident powers and confirmed that the DuMond diagram of DCM changed from a parallelogram to a willow-leaf shape owing to thermal deformation. Additionally, we acquired the lattice deformation profile of the first crystal by analyzing the willow-leaf DuMond diagram and estimated the saturation intensity curve of the DCM using a hyperbolic tangent function analogous to the magnetization equation.

2

Theory

DuMond is a geometric method that qualitatively or semi-quantitatively illustrates the crystal diffraction characteristics of X-rays [28-30]. In principle, it can also be used to characterize the thermal deformation of monochromator crystals [31]. However, conventional experimental method is inefficient and has low precision when obtaining the DuMond diagram. This process involves multiple scans of the rocking curves of the DCM using an analyzer crystal with a specific wavelength and then stitching these curves together [32].

2.1
Angular divergence-bandwidth coupling and DuMond diagram of a monochromatic x-ray

According to X-ray dynamical diffraction theory [33], a coupling relationship exists between the beam divergence and bandwidth. Even when the incident white beam is perfectly parallel, the diffracted beam exhibits a certain bandwidth. Similarly, even when the incident divergent beam is perfectly monochromatic, the diffraction beam has an angular divergence limited by the Darwin width. For an SR beam with vertical and horizontal angular divergences, the beam’s cross-section from the DCM forms a rectangle with a specific energy bandwidth. For example, for a crystal placed horizontally in DCM, photons of different energies and angles do not have a specific distribution in the horizontal direction, and the photon distribution in the vertical direction is characterized by the top region comprising lower-energy photons with high diffraction angles and the bottom region comprising higher-energy photons with low diffraction angles. However, because of the dynamic diffraction theory, the exact values of the two coupling quantities, energy, and angle of the photon cannot be quantitatively determined simultaneously. This phenomenon impedes further improvement in measurement accuracy with rocking curves, typically obtained in the presence of divergence-bandwidth coupling.

To decouple the angular divergence and beam bandwidth, a DuMond diagram is used to replace the direct beam after the monochromator [29, 32]. The DuMond diagram was transformed from phase space to real space using a new experimental setup containing an analyzer orthogonal to the DCM and a 2D detector. A DuMond diagram can be imaged directly on a detector by diffracting the beam after DCM horizontally, resulting in a specific location distribution of photons with different energies and horizontal divergence angles [27]. In the rectangular cross-section of the beam, the vertical axis allows accurate determination of the vertical divergence angle, and the horizontal axis is used to determine the energy accurately. After decoupling the divergence bandwidth, a DuMond diagram imaged in real space can characterize a monochromator with high precision.

The diffraction lattice planes and probe energies were considered. The DuMond diagram is based on the relationship between the diffraction angle θ and wavelength λ in the Bragg formula for X-rays. At equal wavelengths, higher indices, such as 333 and 555, had narrower Darwin widths and gentler slopes than the lower index of 111. For example, for the diffractions of Si(111), (333), and (555) with energies of 18 keV, the Darwin widths were ωD111=2.95, ωD333=0.64, and ωD555=0.25, respectively. This implies that a higher diffraction index can achieve better energy and angular resolution but at the expense of the beam intensity. DCM typically has the lowest index of 111 to achieve a higher beam flux. However, the resolution of 111 diffraction is insufficient for measuring the thermal deformation of monochromator crystals, which requires a resolution of less than 1″.

Considering the integrated aspects of the experimental implementation, detection, and precision, we chose an index of 333 and an energy of 18 keV. The 333 diffraction has an energy resolution of 1/14.5 of the 111 diffraction, which can improve the resolution by more than one order of magnitude. Because synchrotron radiation has a broad spectrum, the λ and λ/3 components corresponding to the indices 111 and 333 exist simultaneously in the DCM beam. The measurements were obtained with 333 diffractions at 18 keV, whereas the monochromator crystal Si(111) was operated at 6 keV.

2.2
DuMond diagram of an ideal working DCM

DCM with two identical Si crystals is commonly used in synchrotron radiation beamlines. The first crystal diffracts the incident white beam at a certain wavelength and bandwidth to the second crystal. The second crystal diffracts the monochromatic beam to maintain the original direction of the incoming beam, which is insusceptible to diffraction angle variation. Ideally, the two perfect crystals with equal indices are flat and symmetric, and the DuMond diagrams of the DCM are parallelograms (whether detuned or not).

In the next section, we briefly describe the detuning phenomenon of two flat crystals to distinguish it from the thermal deformation case. The intensity of the beam exiting the DCM was maximized when the diffraction planes of the two crystals were perfectly parallel. Any deviation from the parallel state is known as detuning and is quantified by the deviation angle from the parallel position, the detuning angle. Assuming a slight detuning angle α between the two crystals without thermal deformation, the DCM beam intensity at a particular energy E is proportional to the following factors [34]: I(E,α)N(E)R(α)cotθBΩ2+ω2(α) (1) where N(E) is the incident beam intensity at spectral energy E with a bandwidth of Δ E, θB is the Bragg angle, R(α) is the total reflectivity of the two crystals at a certain detuning angle α, Ω is the divergence angle of the incident beam (which is related to the synchrotron radiation source and opening of the front slit), and ω(α) is the acceptance angle width of the double-crystal diffraction. The rocking curve of the first crystal is identical to that of the second R1(θ)=R2(θ). Therefore, R(α) is only a function of the detuning angle α: R(α)=1/2γ1/2γR1(θα)R2(θ)dθ. (2) The integration interval of the variate θ is the angular divergence of the synchrotron radiation source, which is generally larger than the Darwin width of the crystal diffraction. The acceptance angle ω(α) of the double-crystal diffraction is given by Eq. (3): 1ω2(α)=1(ωsα)2+1ωs2. (3) Here, ωs is the common intrinsic angular width (Darwin width) of the first and second crystals (Figs. 1(a)). The relative intensity of the exit beam of the DCM at the detuning angle α is given by I(α)I(0)=R(α)Ω2+ω2(α)R(0)Ω2+ω2(0). (4) In this study, the 333 diffraction has a Darwin width of 0.64″ at 18 keV, and the incidence angle Ω is generally tens or tens of arcseconds.

Fig. 1
(Color online) (a) DuMond diagrams of DCM at different detuning angles. For two perfect flat crystals without deformation, the shape of the overlap of their DuMond diagrams is always a parallelogram. (b) Variation in the overlap degree of two crystal rocking curves at different detuning angles. The area where the rocking curves of the two crystals overlap represents the beam flux. (c) Relative beam intensity is calculated by the overlapping areas (The parameters are energy of 18 keV and diffraction index of 333). The ordinate of beam intensity ratio is normalized by the overlapping area at the detuning angle α=0″
pic

In addition to the total beam intensity, geometrically representing the diffraction process using DuMond diagrams is more intuitive. We began with a condition without thermal deformation, as illustrated in Fig. 1(a), which shows a DuMond diagram of an ideal DCM. The two vertical black dotted lines indicate the angular divergence range of the incident synchrotron radiation (the divergence angle of the bending magnet light source was approximately 1/γ). The red and black oblique lines indicate the dynamic diffraction bands (DuMond diagram) of the first and second crystals, respectively, and α is the detuning angle between the two crystals. The colored area is the overlapping part of the DuMond diagrams of the two crystals, the DuMond diagram of DCM. It depicts how the diffraction beam varies with the detuning angle: as the detuning angle α increases, the horizontal width of the DuMond diagram narrows, and the photon intensity decreases. Figure 1(b) shows the θ-I sectional profile of the DuMond diagram (with the intensity axis I perpendicular to the surface of the paper), that is, the rocking curves of the first and second crystals. Here, the colored area represents the overlapping part of the two rocking curves corresponding to the beam intensity. α is the detuning angle between the two crystals, which varies as the rocking curve of the first crystal translates, whereas the rocking curve of the second crystal remains fixed. Figure 1(c) shows the relationship between the beam intensity and detuning angle α, which is obtained from the overlapping areas of the two rocking curves at different detuning angles in Fig. 1(b). When the two crystals were parallel (α=0), their rocking curves completely overlapped when the beam intensity reached its maximum value. As the absolute value of the detuning angle α increased, the overlapping area of the two rocking curves and the beam intensity decreased.

Figure 1 illustrates the primary principles of the measurement method reported in this study. It is essential to emphasize that although this may appear similar to scanning rocking curves, there are distinctions between the two methods owing to the experiments. Compared with scanning rocking curve, the θ-I-sectional profile of the DuMond diagram was obtained by removing the divergence-bandwidth coupled photons from the beam. In addition, the latter is directly obtained in one image without rotating the monochromator; therefore, the incident power density and thermal deformation do not vary.

2.3
DuMond diagram of a DCM with deformed crystal

Under ideal conditions without thermal deformation, regardless of the detuning angle, the lattice planes of the two crystals were flat. In real operation, the first crystal of the DCM is irradiated with a high-power white beam, which causes lattice deformation and expansion. The beam incident on the second crystal is already monochromatic; thus, its heat power is negligible [7]. The deformation can be interpreted as follows. The crystal surface is divided into numerous flat minute-area cells along the beam footprint, with one microfacet of the first crystal and one microfacet of the second crystal constituting a microfacet pair. The total intensity of the beam exiting the DCM is the sum of the intensities of all microfacet pairs. The detuning angles α are identical for every microfacet pair without thermal deformation. When the first crystal surface undergoes thermal lattice deformation, the normals of microfacets at different positions x on the first crystal are tilted by different angles Δα, whereas the normal direction of each microfacet on the second crystal remains constant. The detuning angle between a pair of microfacets is α=α0+Δα, where α0 is the macroscopic detuning angle between the two crystals before the thermal deformation.

Then Eq. (2), and Eq. (3) can be rewritten as follows: R(α0)=Δα1Δα21/2γ1/2γR1(θα0Δα)R2(θ)dθdΔα, (5) 1ω2(α0+Δα)=1(ωsα0Δα)2+1ωs2. (6) The integration interval of θ is the angular divergence of the synchrotron radiation source, and the integration interval of Δα is the range of normal tilt angles of microfacets within the light footprint on the crystal surface.

As shown in Fig. 1(a), DuMond diagrams of ideal DCM are always parallelograms. The sequence of parallelogram DuMond diagrams shows the detuning phenomenon on the timescale introduced by rotating the adjustable crystal. This is significantly different from the distorted DuMond diagrams that show the spatial distribution of the detuning phenomenon induced by thermal deformation. Similarly, Fig. 2(a) shows DuMond diagrams representing the diffraction process of a deformed crystal. For a point light source, the diffraction-angle range of the flat crystal is limited only by the angular divergence of the light source, as shown in the upper right diagram in Fig. 2(a). However, the diffraction angle range of the deformed crystal is bounded by both the source angular divergence and angular deformation of the crystal surface, as shown in the upper left diagram of Fig. 2(a). It is necessary to consider the physical meaning when two such crystals comprise a DCM. To unify the angle ranges of the two DuMond diagrams, the transverse axis of the actual diffraction angle θ is replaced by the light-source divergence angle θ′, as illustrated in the lower diagrams of Fig. 2(a). Beams with different divergence angles were incident on the microfacets of the first crystal, which had different local deformation angles Δα. These deformation angles change the actual diffraction angle of the first crystal and introduce local offsets into the DuMond diagram. The DuMond diagram of the DCM with a macroscopic detuning angle α0=0 is shown on the lower left and the DuMond diagram of the DCM with a small macroscopic detuning angle α0is shown on the lower right. Comparing to Fig. 1(a), the DuMond diagram of the DCM with a deformed crystal undergoes a significant distortion in shape and shifts its position as the macroscopic detuning angle of the DCM varies.

Fig. 2
(Color online) (a) Schematic diagram illustrating DuMond diagrams of the DCM with a deformed first crystal and a flat second crystal. The transverse coordinates in the upper two figures represent the actual diffraction angle, while transverse coordinates in the lower two figures depict the divergence angle of the light source. (b) Schematic diagram of DuMond diagrams obtained in real space. In the upper case of two flat crystals, the only effect caused by the different α0 is the different widths of the parallelograms, and their normalized integral intensity curves remain the same
pic

The experimental configuration allowed us to directly observe the DuMond diagrams of the monochromator under the operational conditions. As shown in Fig. 2(b), the upper figure illustrates a DCM crystal without thermal deformation, whereas the lower figure depicts a DCM crystal with thermal deformation. The beam underwent sequential longitudinal diffraction by the two crystals and subsequent horizontal diffraction by a downstream analyzer (omitted in the figure). The resulting image on the 2D detector was a divergence-bandwidth-decoupled light spot corresponding to the DuMond diagram of the DCM. The ordinate represents the vertical divergent angle of the beam exiting the DCM, the abscissa represents the energy distribution of the beam decoupled by the analyzer crystal, and the color shades represent the photon intensity. Without thermal deformation, the DuMond diagram appears as a parallelogram of uniform color. With thermal deformation, the DuMond diagram assumed a willow-leaf shape with an uneven color distribution. The distortion of the DuMond diagram can be quantified by the intensity loss, as illustrated by the rightmost integral intensity curve in Fig. 2(b). After eliminating the energy effects through horizontal integration, only the two-dimensional correspondence between the longitudinal divergence angle and the intensity was retained. The rightmost integration curve corresponds to the intensities of microfacet pairs at different longitudinal positions on the crystal surface. For a certain α0, the output intensity of a pair of microfacets is directly related to the deformation angle Δα. The central width of the willow-leaf-like DuMond diagram was comparable to that of the parallelogram DuMond diagram and progressively diminished as the position moved away from the central region. Meanwhile, both ends of the rightmost integral intensity curve show a decline.

3

Experiment

Synchrotron radiation from a bent magnet is uniform in the horizontal direction; for our analysis, we assume that the cooling effect of the first crystal is also horizontally uniform [35]. In this context, the 1D crystal profile along the propagation direction of the beam is sufficient to characterize the crystal thermal deformation. Utilizing the special machine time for commissioning a new beamline of the SSRF [36], we established a measurement system with an orthogonal analyzer crystal at BL09B. The behavior of the lattice deformation of the first crystal versus the increase in the ring current can be observed.

3.1
Experimental configuration, instruments, and parameters

An energy of 6 keV was selected as the operating energy of DCM Si(111), where the Bragg angle was 19.24, and the energy of the Si 333 diffraction was 18 keV. The experimental setup is illustrated in Fig. 3. With the light source as the origin point, the white light slit, DCM, and beryllium window were located at locations of 18.2 m, 21 m, and 38 m, respectively. The analyzer crystal Si(333) was at a distance of 39 m from the light source and was orthogonal to the crystals inside the DCM. The 2D detector is at a distance of 0.5 m from the analyzer crystal, and the dynamic range of the detector is 12 bits. The white beam is radiated to the DCM, and the monochromatic beam after the DCM is diffracted horizontally and decoupled by the analyzer Si(333), removing the energy-angle coupled photons that cannot satisfy both the energy and angle criteria. The initial beam with a rectangular cross-section was transformed into a tilted DuMond spot on the 2D detector monitor. The tilt angle, fixed at 45, is consistent because of the fixed and identical index planes for the horizontal and vertical diffraction.

Fig. 3
(Color online) Schematic diagram of experimental setup. After being diffracted by the analyzer placed vertically, the original rectangular output beam of the DCM manifests as a light spot inclined at an angle of 45° on the imaging detector, representing the DuMond diagram of the DCM
pic

The opening size of the white light slit is 3.15 mm × 1.75 mm (H × V). The horizontal and vertical dimensions of the incident white beam arriving at the front of the DCM are 3.63 mm and 2.02 mm, respectively. The first crystal had dimensions of 50 mm × 70 mm × 15 mm (L × W × H) and was indirectly water-cooled at a temperature of 25 ℃ at a flow rate of 0.9 L/min. After exiting the beryllium window and traveling 1.5 m in the atmosphere, the 6 keV component of the beam decayed to 1.7% of its initial intensity, whereas the 18 keV component remains at 85.7% of its initial intensity. Therefore, it can be concluded that the photons arriving at the 2D detector were 18 keV reflected by the 333.

In this study, a series of DuMond diagrams were obtained under different ring currents using the above experimental configuration. The correspondence between the ring current and the power density of the light source and that of the first crystal surface is shown in Table 1. The calculation was performed using Spectral [37].

Table 1
Conversion of ring current to synchrotron radiation power of BL09B at SSRF
Ring current (mA) Peak power density of source (W/mrad2) Total power at crystal surface (W) Peak power density at crystal surface (W/mm2)
8.3 3.0 0.402 0.020
9.9 3.6 0.482 0.023
19.8 7.2 0.964 0.047
48.3 17.5 2.352 0.113
85.7 31.0 4.174 0.201
94.4 34.1 4.598 0.222
148.2 53.6 7.223 0.348
170.9 61.8 8.712 0.420
197.5 71.4 9.738 0.469
220.3 79.7 10.727 0.517
Show more
3.2
Experimental procedure and results

To compare and demonstrate the distortion of the DuMond diagram, we observed DuMond diagrams at a low storage ring current (9.9 mA) measured with 333 diffraction and 18 keV and DuMond diagrams at a high storage ring current (220.3 mA) measured with 111 diffraction and 6 keV. The DCM of BL09B is equipped with a precision rotation mechanism consisting of a motor and piezoelectric device on the first crystal, which can alter the macroscopic detuning angle α0 between the two crystals by rotating the first crystal.

Figure 4 shows the DuMond diagrams of the DCM decoupled by an orthogonal analyzer, sampled at an exposure time of 500 ms. The ordinate and abscissa represent the original vertical angle distribution and the wavelength of the beam from the DCM, respectively. Both axes are expressed in detector pixels, and the brightness of the spot indicates the beam intensity. Fig. 4(a) and 4(b) show the measurement results for indices 111 and 333, respectively, at different macroscopic detuning angles α0. Figure 4(a) and 4(b) show that when the detuning angle α0=0, the DuMond diagram has the maximum intensity and full width at half maximum (FWHM), regardless of whether the indexes are 111 or 333. The light spot intensity and transverse size decreased as the detuning angle increased. It is also worth emphasizing that all the measured spots had the basic shape of a parallelogram in either case. This result can be interpreted as follows: at a low current, the heat load on the crystal is marginal, and the detected thermal deformation is not significant, even if we used a Si 333 analyzer. At a high current, the heat load on the crystal was high, and the thermal deformation on the crystal surface was significant. However, the basic shape of the observed DuMond diagram remains a parallelogram owing to the low sensitivity of the diffraction index 111.

Fig. 4
(a) DuMond diagrams at various macroscopic detuning angles α0, measured with the low sensitivity index 111 and 6 keV under high heat load (220.3 mA). (b) DuMond diagrams at various macroscopic detuning angles α0, measured with the high sensitivity index 333 and 18 keV under low heat load (9.9 mA). (c) DuMond diagrams at various macroscopic detuning angles α0, measured with the high sensitivity index 333 and 18 keV under high heat load (220.3 mA). (d) DuMond diagrams at different storage ring currents with a fixed macroscopic detuning angle α0, measured with the index of 333 and 18 keV
pic

To verify whether the willow-leaf-like distortion of the DuMond diagram was due to thermal lattice deformation, we maintained a higher ring current of 220.3 mA and measured DuMond diagrams with 333 diffractions. Figure 4(c) shows the willow-leaf-like DuMond diagrams at different macroscopic detuning angles α0, which were altered by rotating the first crystal forward and reverse. The brightest position in the spot corresponds to the minimum detuning angle α=Δα+α0=0. As the first crystal rotates, the brightest position in the spot gradually shifts from the lower-right corner, with a low diffraction angle and high energy, to the upper-left corner, with a high diffraction angle and low energy. However, irrespective of how the crystal was rotated, the DuMond diagrams did not form parallelograms with uniform brightness and width at all positions, as shown in Fig. 4(a) and 4(b). This is consistent with the detuning phenomenon of DCM with a deformed crystal, as shown in Fig. 2(a), indicating the distribution of local deformation angles Δα(x) between the two crystals.

Figure 4(d) shows the DuMond diagrams obtained when DCM was operated under different storage ring currents. The beam was held in each state for a period to ensure that all samples were in an equivalent operating condition, except for the ring current. As the ring current increased to 85.7 mA, the DuMond diagram showed a distinct nonuniform intensity distribution: the spot intensity was higher in the middle and lower at both ends in both the energy and angle directions. As the ring current increases to 148.2 mA, the DuMond diagram transforms from a uniform parallelogram to a willow-leaf shape with narrow ends. This suggests that the spatial detuning phenomenon characterized by the local deformation angle Δα(x) is a consequence of the heat load on the DCM. In addition, the presence of local light or dark points in the figure can be attributed to crystal defects. These points do not vary with increasing current but can be eliminated by varying the position of the crystal surface receiving light during the measurement.

4

Data analysis and discussion

The distortion in the DuMond diagram originates from the local deformation angle Δα(x). Thus, the thermal deformation profile of the first crystal can be obtained by quantitatively analyzing the willow-leaf DuMond diagram. We consider a DuMond diagram with α0=0 in Fig. 4(c) as an example to illustrate data processing briefly.

Assuming that the light is a point source, the coordinates of the spot on the detector can be backtracked to the footprint coordinates on the first crystal surface using geometric optical tracing. It can be theoretically determined that the vertical footprint size of the first crystal is 6.07 mm. The pixel size of the 2D detector is 7.4 μm, which corresponds to 11.9 μm on the first crystal surface, considering the angular divergence of the beam and the distance between the detector and the monochromator. Figure 5(a) shows the contour plot of the DuMond diagram with α0=0 shown in Fig. 4(c) after the ordinate is converted. The measured size of the light footprint on the first crystal surface in the vertical direction is 5.9 mm.

Fig. 5
(Color online) (a) Contour plot of the DuMond diagram at α0=0 measured by Si(333) diffraction under ring current of 220.3 mA. The ordinate and abscissa represent the position of the spot on the first crystal surface. (b) Intensity distribution I(x) of the beam on the first crystal surface obtained from the willow-leaf-like DuMond diagram in Fig. 5(a). (c) Theoretical relative intensity I(α) of the Si(333) diffraction at 18 keV at different detuning angles α. (d) Deformation angles Δα(x) of the microfacets on the first crystal surface. The maximum deformation angle in the light footprint area is 4.5 microradians. (e) Deformation height h(x) and radius-of-curvature R(x) within the light footprint on the first crystal surface. The solid red line with the left axis is the deformation height h(x) of the first crystal, which is the raw integral of Δα(x). The dotted blue line with the right axis is the first crystal deformation profile’s radius-of-curvature R(x)
pic

Figure 5(b) shows the relative intensity I(x) at various positions x in the vertical direction within the light footprint of the first crystal. It is derived from Fig. 5(a) by removing the background intensity, transversely integrating it, and normalizing it based on the maximum intensity. The maximum relative standard deviation resulting from the statistical fluctuation in the photon number was 2.6%. In Fig. 5(c), the relative intensity I(α) with different detuning angles α is presented and calculated in the same manner as that shown in Fig. 2(c)). The deformation angle Δα(x) on the first crystal surface was determined by substituting the measured intensity distribution I(x) at different locations into the calculated intensity distribution I(α) at different detuning angles. For example, the detuning angles at the positions x1, x2 and x3 are Δα(x1)=α1, Δα(x2)=α2, Δα(x3)=α3, respectively. The deformation angle distribution Δα(x) on the first crystal surface is shown in Fig. 5(d).

In geometric measurements, a common indirect representation method uses normal direction information [38]. The deformation angle distribution Δα(x) characterizes the deformed surface of the first crystal. Integrating Δα(x) over x yields the height h(x) of the deformation profile on the first crystal surface, as indicated by the solid red line on the left axis in Fig. 5(e). The maximum relative standard deviation was 4.2%, and the maximum standard deviation was 0.1nm. It should be noted that the zero value of height h(x) in Fig. 5(e) shows the initial point of the integration. Value of the point is an artificially set relative zero value. By fitting the deformation height h(x) once and then differentiating the fitting result with respect to x twice, the reciprocal of the absolute value of the differential result is the radius of curvature R(x) on the first crystal surface, which is indicated by the blue dotted line on the right axis in Fig. 5(e). There are inflection points but no extreme points on either side of the radius curve because the operando optics method can only measure deformations within the light footprint, and the extreme points may have been outside the range of the light footprint.

We now focus on the thermal deformation at different ring currents. We dealt with the observations using the above method for ring currents 8.3 mA, 19.8 mA, 48.3 mA, 85.7 mA, 94.4 mA, 148.2 mA, 170.9 mA, and 197.5 mA. Figure 6(a) shows the surface morphology of the first crystal after irradiation with X-ray beams with different ring currents. The vertical coordinates represent the deformation height, the transverse coordinates represent the light footprint coordinates on the first crystal surface, and the oblique coordinates represent the total incident power.

Fig. 6
(Color online) (a) Thermal deformation profiles on the first crystal surface under different powers. (b) Variations in the maximum height, height deformation factor, and central radius-of-curvature of thermal lattice deformation on the crystal surface with the incident power and power density. Considering that the crystal may not have reached thermal equilibrium during the short sampling interval between 4.17 W and 4.60 W, we take the average of the two measurements as one point, calculating the height deformation coefficient. (c) Measurement and simulation of beam intensity at different crystal receiving powers. The critical points of Si(111)@6 keV, Si(111)@18 keV, and Si(333)@18 keV are at the incident power of 13.8 W, 6.9 W, and 2.7 W, respectively. Their critical intensities are Ic111@6 keV=10206.8, Ic111@18 keV=4923.1 and Ic333@18 keV=1705.1 in arbitrary units
pic

Figure 6(b) shows the variations in the maximum deformation height, height deformation factor, and radius of curvature at the center of the light footprint with incident power and power density. With increasing incident power and power density, the maximum height of the lattice deformation increases from 3.2 nm to 18.5 nm, and the radius-of-curvature at the profile center decreases from 891 m to 188 m. Theoretically, the maximum deformation should be proportional to the total absorbed power at this temperature range of the silicon crystal. However, the experimental results did not linearize the relationship between the measured maximum deformation and incident power. With increasing incident power and power density, the deformation factor of the maximum deformation increases by three times from 1.1 nm/W to 3.2 nm/W. This implies a decrease in the actual cooling effect of the system.

The intensity of the beam exiting an ideal monochromator is directly proportional to that of the incident beam. Nevertheless, with increasing incident power, thermal effects disturb the normal operation of the optics. Typically, cooling serves as a background function to ensure proper operation of the monochromator, whereas thermal deformation measurements evaluate the cooling technology. These measurements are not typically presented as direct characterization indicators, making it essential to establish a connection between thermal deformation and monochromator performance.

In this study, the more sensitive 333 diffraction was utilized to diagnose thermal deformation, whereas monochromators generally operated at lower indices in applications. For this reason, it is important to consider the performance of Si(111) diffraction. Figure 6(c) illustrates the variation in the DCM output beam intensity at the BL09B beamline. The black dashed line represents the ideal output intensity of 18 keV photons in Si(333) diffraction without thermal deformation. The blue rectangular scatter plot depicts the measured output intensity of the 18 keV photons in Si(333) diffraction. The inferred beam intensity of Si(111) diffraction at 18 keV is shown as a green circular scatter plot, and that at 6 keV is shown as a magenta triangular scatter plot. The curves of intensity I(α) at different detuning angles for Si(111)@18 keV and Si(111)@6 keV can be calculated in the same manner as shown in Fig. 1(b) and 1(c). The output beam intensity of the Si(111) diffraction can then be inversely inferred by incorporating the measured deformation angle Δα(x) into the calculated intensity curves I(α). As the incident power increased, the actual measured Si(333) diffracted output beam intensity of 18 keV tended to saturate significantly, and the calculated Si(111) diffracted output beam intensities of 6 keV and 18 keV deviated from the proportional straight line.

The saturation of the output intensity can be demonstrated intuitively by a preliminary fitting of the experimental data using the hyperbolic tangent function Iout=a tanh(bPin). The fitting coefficient a is related to the dynamic diffraction of the crystal and is equal to the saturation intensity. For a known lattice deformation profile, the coefficient a is proportional to the Darwin width and total reflectance of the two parallel flat crystals. As the rate of tendency to saturation, the coefficient b is related to the thermophysical parameters of the crystal and is influenced by the incident power density, surface temperature gradient, and penetration depth. The colored solid lines in Fig. 6(c) show the simulation of the output beam intensity as the total power received by the crystal increases from 0 to 35 W. At low-power incidence, the output beam intensity was proportional to the input beam intensity. When the incident power increased to a certain extent, a loss due to thermal deformation began to appear. Eventually, as the incident power continued to increase, the output intensity gradually became saturated under the dual action of excitation by the input intensity and inhibition by thermal deformation. In the initial stage of deformation, most of the detuning angles between microfacet pairs are in the steep region of the curve shown in Fig. 5(c). At this time, the flux loss was faster, and the growth trend of the output beam intensity with increasing incident power began to slow down. As the received power of the crystal increased, the thermal lattice deformation increased, and the detuning angles between microfacet pairs gradually exceeded the Darwin width (which is the permissible diffraction range) and translated to the gentle region of the curve in Fig. 5(c). The beam flux is now significantly lost, but the loss rate is reduced. The output beam intensity gradually saturates, reaches the saturation intensity Is, and no longer increases with the incident power.

Referring to the definition of the time constant, we consider (1-1/e) times the saturation intensity as the critical point for evaluating the cooling limit of the monochromator or the maximum input power that the monochromator can withstand using certain cooling technology. Before reaching the critical intensity, Ic=(1-1/e)Is, the crystal can be considered to be in an operating condition with efficient heat treatment, and the output intensity increases linearly with the input intensity. The thermal treatment effect is poor when the output beam exceeds the critical intensity. Even if the incident power is continuously increased, the increase in the output beam intensity is quite limited. Thermal deformation of the monochromator crystal limits the intensity growth; however, we can expand the linear working region of the monochromator by improving its working conditions. For a certain diffraction crystal plane and light wavelength, for example, the critical point can be shifted backward by optimizing the heat-treatment design and reducing the temperature gradient on the crystal surface.

5

Conclusion

Compared to computer simulations, there is a need for high-precision inspection techniques for thermal lattice deformation, which is one of the underlying factors affecting the performance of monochromators. In this paper, we present a new method for efficiently characterizing the thermal lattice deformation of monochromator crystals under service conditions, report nanometer-scale thermal lattice deformation profiles of an indirectly water-cooled DCM at a bent magnet beamline, and predict the performance of the monochromator under this cooling condition at higher incident power. The method presented in this report has nanoscale resolution, with a measurement time of only a few hundred milliseconds while the DCM is in operation. These features make it possible to monitor the thermal deformation of the monochromator in real time without interrupting downstream experiments. Furthermore, these results and future measurements at higher power densities and different cooling systems provide solid constraints for computer simulations of thermal treatment design and serve as an anchor for combining simulation calculations with actual operations.

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Footnote

The authors declare that they have no competing interests.