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Secondary electron emission model for photo-emission from metals in the vacuum ultraviolet

NUCLEAR PHYSICS AND INTERDISCIPLINARY RESEARCH

Secondary electron emission model for photo-emission from metals in the vacuum ultraviolet

Ai-Gen Xie
Yi-Fan Liu
Hong-Jie Dong
Nuclear Science and TechniquesVol.33, No.8Article number 103Published in print Aug 2022Available online 22 Aug 2022
47201

This study investigates two secondary electron emission (SEE) models for photoelectric energy distribution curves f(Eph, hγ), B, Emean, absolute quantum efficiency (AQE), and the mean escape depth of photo-emitted electrons λ of metals. The proposed models are developed from the density of states and the theories of photo-emission in the vacuum ultraviolet and SEE, where B is the mean probability that an internal photo-emitted electron escapes into vacuum upon reaching the emission surface of the metal, and Emean is the mean energy of photo-emitted electrons measured from vacuum. The formulas for f(Eph, hγ), B, λ, Emean, and AQE that were obtained were shown to be correct for the cases of Au at hγ = 8.1-11.6 eV, Ni at hγ = 9.2-11.6 eV, and Cu at hγ = 7.7-11.6 eV. The photoelectric cross-sections (PCS) calculated here are analyzed, and it was confirmed that the calculated PCS of the electrons in the conduction band of Au at hγ = 8.1-11.6 eV, Ni at hγ = 9.2-11.6 eV, and Cu at hγ = 7.7-11.6 eV are correct.

Absolute quantum efficiencyPhotoelectric cross-sectionMean escape depth of photo-emitted electronsProbabilityPhoto-emission from metalsSecondary electron emissionVacuum ultravioletMean energy of photo-emitted electrons
1

Introduction

The photoelectric effect is important in various domains, such as astrophysics, material analysis applications, photon science, interactions between photons and materials, photo-multipliers, photo-injectors such as RF photo-cathode gun in accelerators, and X-ray sources [1-3]. Photoelectric energy distribution curves f(Eph, ) can be used to characterize the properties of the photoelectric effect, Eph is the energy of photon-induced electrons with E measured from the bottom of the conduction band of metal, E is the initial energy of electrons measured from the bottom of the conduction band of metal, h is the Plank constant, and γ is the photon frequency. Thus, many researchers have investigated f(Eph, ) [4-5]. From the fact that SEE and photo-emissions have the same escape and transport mechanisms [6-7] and the characteristics of electron-photon interaction and propagation of photons, two formulas for f(Eph, ) from metals in the vacuum ultraviolet have been obtained. Further, the value of f(Eph, hγ) obtained from Au at = 8.1-11.6 eV, Ni at = 9.2-11.6 eV, and Cu at = 7.7-11.6 eV have been proven to be true.

The absolute quantum efficiency (AQE)() and quantum efficiency (QE)() are important parameters that are used to characterize photo-emission ability [8-10]. The mean probability that an internal photo-emitted electron escapes into vacuum upon reaching the emission surface of metal B and λ are important parameters of AQE() and QE(), where λ denotes the mean escape depth of photo-emitted electrons. The B is inaccessible to measure; further, the formula for B and λ has not yet been deduced. It is difficult to measure λ, and the relative differences among the λ values measured by different authors can reach about 100% or more [11-13]. Thus, there is the need for theoretical studies of B and λ. The value of the mean energy of photo-emitted electrons Emean measured from vacuum is an important parameter to assess the mechanisms of energy loss of internal photo-emitted electrons. The internal photo-emitted electrons lose energy mainly by electron-phonon scattering for the case of Emean < 1.0 eV; however, they lose energy mainly by electron-electron scattering [13] for the case of Emean >1.0 eV. From the two formulas for f(Eph, ) deduced here and the definitions of B, Emean, and λ, the respective formulas for B, λ, and Emean for metals in the vacuum ultraviolet have been deduced. Based on the fact that the deduced formulas for f(Eph, ) obtained from Au, Ni, and Cu have been experimentally proven and the courses of deducing the formulas for B, Emean, and λ from metals, it can be concluded that B, Emean, and λ from Au at = 8.1-11.6 eV, Ni at = 9.2-11.6 eV, and Cu at = 7.7-11.6 eV calculated with corresponding deduced formulas are correct.

Photoelectric cross-section PCS is an important topic [14-16], and it has been investigated by many researchers PCS [17]. However, owing to the complexity and difficulty of researching PCS at hγ < 50 eV, there are few reported values of measured and calculated PCS at hγ < 50 eV [18]. Furthermore, the relative differences among the PCS values at hγ<50 eV obtained by different authors can reach about 200% or more [19]. Thus, it is important to present accurate methods of determining PCS at hγ < 50 eV. From the energy band structures of metals, the definition of AQE(), and one of the formulas for f(Eph, ) deduced here, the formula for AQE() from metals in the vacuum ultraviolet as a function of the density of states, PCS, Aα, Φ, EF, Eph, hγ, s and ρ has been deduced, where Aα is the molar mass of an atom, ρ is the material density, Φ is the work function, EF is the distance from the bottom of conduction band to Fermi level, and s denotes the number of electrons of conduction band that is provided by one atom. Using the deduced formula for AQE(), experimental AQE() [20-21], and known parameters such as density of states, Aα, Φ, EF, hγ, s, and ρ, the PCS of the electrons in the conduction band of Au at = 8.1-11.6 eV and Ni at = 9.2-11.6 eV are calculated. These calculated PCS are analyzed, and it can be concluded that the calculated PCS of the electrons in the conduction band of Au at = 8.1-11.6 eV and Ni at = 9.2-11.6 eV are correct, and that the method presented here of calculating PCS with the deduced formula for AQE() is a very accurate method.

According to the simple theories of SEE, the fact that SEE and photo-emission have common escape and transport mechanisms [6-7], and the definition of AQE(), the universal formula for AQE() has also been deduced. For negative electron affinity semiconductors (NEAS), the deduced universal formula for AQE() has the same expression as the existing formula for AQE() obtained from NEAS used in some studies [22-24]. The method of calculating PCS using the deduced universal formula for AQE() as well as parameters such as experimental AQE() [20-21, 25], B, and λ is also presented. The PCS of the electrons in the conduction band of Au, Ni, and Cu are calculated using this method and are analyzed. It can be concluded that the calculated PCS of the electrons in the conduction band of Au at = 8.1-11.6 eV, Ni at = 9.2-11.6 eV, and Cu at = 7.7-11.6 eV are correct, and that the proposed method of calculating PCS using the deduced universal formula for AQE() is more accurate.

2

Processes of photo-emission

When N0 photons at γ<(EF+Eg)/h enter perpendicularly into metals, the number of incident photons at x can be written as follows [13, 26-27]: N(x)=N0eαγx=N0ex/λγ, (1) where x is the distance from the incident surface to the position at which the photons arrive, N0 is the number of incident photons at x=0, and αγ is the optical absorption coefficient at γ. From the energy band structures of metals shown in Fig. 1 (Eg is the distance from the top of the valence band to the bottom of the conduction band of metals), the quantum theory, and law of energy conservation, it is known that in the case that N0 photons at γ < (EF+Eg)/h enter perpendicularly into metals, only the electrons in the conduction band of the metal can be excited by the photons.

Fig. 1
Schematic energy band structures of metals.
pic

According to the characteristics of electron-photon interaction, it is known that the probability that all of the electrons in the same energy band of a given metal absorb one photon at a given γ can be approximated as a constant [14, 28-29]. Thus, the probability that the electron in the conduction band of a given metal absorbs one photon at a given γ can be approximated as a constant Cγ. That is, the PCS at a given γ of the electrons in the conduction band of a given metal can be approximated as a constant Cγ. Based on the energy band structures of metal shown in Fig. 1, the calculated number of electrons per atom per eV g(E) [20-21, 25], the values of EF, the law of energy conservation, and the fact that γ is < (EF+Eg)/h, we can calculate the relative number of electrons in the conduction band of a metal that may absorb one photon and become photo-excited electrons. For example, when the photons at = 7.4 eV enter Au with EF = 11.6 eV [20], the electrons with E ≧ (EF-7.4 eV) (i.e., 4.2 eV) may absorb one photon and become photo-excited electrons. Thus, based on the g(E) value of Au [20], the fact that the electrons with E ≧ 4.2 eV may become photo-excited electrons and the fact that the EF value of Au equals 11.6 eV, we can obtain n% of electrons in the conduction band of Au, which may absorb one photon and become photo-excited electrons based on calculations, and the obtained n% for Au at = 7.4 eV equals 0.808; using the same method, we obtain n% at different values of Au, Ni, and Cu, and the corresponding results are shown in Tables 1, 2, and 5, respectively. Therefore, from the definition of αγ [13, 26] in Eq. (1) and the fact that the probability that the electron in the conduction band of a given metal absorbs one photon at a given γ can be considered as a constant Cγ, the αγ parameter of Eq. (1) can be written as: αγ=λγ-1=(sρCγn%NA)/Aα (2)

Table 1
The parameters of Au calculated using the first SEE model.
M hγ(eV)) ExperimentalAQE(hγ) [20] CalculatedAQE(hγ) m% [20] n% [20] Cγ(10-23m2) λγ(10-9m) λ (10-9m) B Emean(eV)
7.4 0.000800 0.000696 0.0734 0.808 34.3 5.56 2.590 0.0241 1.38
7.7 0.00110 0.000975 0.106 0.845 35.2 5.18 2.56 0.0235 1.46
7.9 0.00140 0.00125 0.135 0.867 37.0 4.81 2.56 0.0231 1.49
8.1 0.00175 0.00158 0.167 0.887 37.8 4.60 2.55 0.0235 1.52
8.7 0.00320 0.00297 0.266 0.938 40.2 4.09 2.50 0.0276 1.82
9.0 0.00420 0.00392 0.320 0.957 41.9 3.84 2.45 0.0301 1.99
9.2 0.00510 0.00479 0.355 0.968 45.2 3.52 2.42 0.0303 2.07
10.4 0.01000 0.00952 0.506 0.995 45.4 3.41 2.16 0.0483 2.55
10.7 0.01200 0.0114 0.548 0.996 49.8 3.11 2.12 0.0509 2.70
11.0 0.01400 0.0133 0.597 0.998 53.1 2.96 2.04 0.0538 2.85
11.2 0.01520 0.0144 0.631 0.999 53.9 2.86 2.00 0.0553 2.93
11.5 0.01700 0.0161 0.682 0.999 54.5 2.83 1.96 0.0575 3.06
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Table 2
The parameters of Ni calculated using the first SEE model.
M hγ (eV) Experimental AQE(hγ) [21] CalculatedAQE(hγ) n%[21] m% [21] Cγ(10-23m2) λγ (10-9m) λ (10-9m) B Emean(eV)
7.6 3.00×10-3 2.67×10-3 1.00 0.362 10.4 10.5 1.74 0.0520 1.83
8.0 5.17×10-3 4.45×10-3 1.00 0.415 14.8 7.40 1.67 0.0583 2.05
8.6 7.82×10-3 6.70×10-3 1.00 0.496 17.6 6.22 1.58 0.0667 2.39
9.2 1.15×10-2 9.78×10-2 1.00 0.605 21.3 5.14 1.51 0.0712 2.71
9.8 1.52×10-2 1.27×10-2 1.00 0.766 22.7 4.83 1.46 0.0712 2.96
10.4 2.49×10-2 2.11×10-2 1.00 0.921 32.5 3.37 1.43 0.0769 3.18
10.5 2.81×10-2 2.40×10-2 1.00 0.938 36.8 2.98 1.42 0.0791 3.23
10.6 2.99×10-2 2.70×10-2 1.00 0.953 41.3 2.65 1.41 0.0815 3.28
10.8 3.05×10-2 2.62×10-2 1.00 0.978 36.0 3.04 1.39 0.0853 3.35
11.0 3.14×10-2 2.71×10-2 1.00 1.00 34.6 3.17 1.37 0.0896 3.45
11.2 3.18×10-2 2.78×10-2 1.00 1.00 32.8 3.34 1.35 0.0965 3.56
11.4 3.20×10-2 2.82×10-2 1.00 1.00 31.1 3.52 1.33 0.103 3.68
11.6 3.22×10-2 2.87×10-2 1.00 1.00 29.7 3.69 1.3 0.11 3.81
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Table 5
The parameters of Cu calculated using the second SEE model.
(eV) Experimental AQE() [25] n% [25] m%[25] Cγ(10-23m2) λγ (10-9m) λ (10-9m) B Emean(eV)
6.8 1.6×10-3 0.694 0.128 43.1 3.58 2.92 0.0193 1.32
7.4 2.6×10-3 0.763 0.237 28.9 4.86 2.92 0.0223 1.35
7.7 3.0×10-3 0.788 0.277 22.8 5.95 2.86 0.0263 1.45
8.1 3.9×10-3 0.817 0.324 21.5 6.09 2.74 0.0317 1.65
8.4 4.5×10-3 0.836 0.361 20.4 6.28 2.65 0.0351 1.81
9.0 5.8×10-3 0.873 0.434 19.1 6.43 2.49 0.0418 2.15
9.6 6.8×10-3 0.906 0.506 17.2 6.87 2.34 0.0479 2.49
10.2 7.8×10-3 0.936 0.570 15.9 7.21 2.21 0.0546 2.84
11.2 8.8×10-3 0.976 0.681 13.5 8.13 2.02 0.0634 3.43
11.6 9.2×10-3 0.989 0.731 12.8 8.43 1.96 0.066 3.65
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The unit of ρ is g/m3, the unit of Aα is g/mol, and NA denotes the Avogadro constant.

Based on the fact that Eph is the energy of photon-induced electrons with E measured from the bottom of the conduction band of a metal, the relation E =Eph- is obtained. Some authors have calculated g(E) [20-21, 25] and the energy distribution of electrons in the conduction band of metal with V = 1.0 m3 G(E) (i.e., density of states of conduction band of metal) [30-31]. According to the definitions of G(E) and g(E) and the relation E = Eph-hγ, the relation between G(E) and g(E) (i.e., the relation G(Eph-hγ) and g(Eph-)) can be written as [30-31]: G(E)=(ρNAg(E))/Aα=G(Ephhγ)=(ρNAg(Ephhγ))/Aα (3)

Processes involved in photo-emission may be considered as three-step processes [21]: first, electrons are excited to become internal photo-emitted electrons; second, a portion of the internal photo-emitted electrons propagate to the emission surface; and third, a portion of the internal photo-emitted electrons reaching the emission surface escape into the vacuum and become photo-emitted electrons. The three-step processes of photo-emission from metal which are investigated in detail in this work are as follows:

Owing to the fact that the PCS for a given γ value of the electrons in the conduction band of a given metal can be considered as a constant Cγ, definitions of αphγ, G(Eph-hγ), and g(Eph-hγ) [13, 26, 30-31] and Eqs. (1) and (3), in the case that No photons at γ < (EF+Eg)/h enter perpendicularly into metals, the number of internal photo-emitted electrons at x per unit path length of incident photons can be written as: n(x)=αphγN(x)=CγG(Ephhγ)N(x)=CγG(Ephhγ)N0eαγx=CγρNAg(Ephhγ)N0ex/λγAα[(EphΦEF)0] (4) where αphγ is the photoelectric absorption coefficient at γ.

Most secondary electrons have energy Evac>1.0 eV [32-33], and the mean energy of secondary electrons emitted from metal Eam is much larger than 1.0 eV, and both Evac and Eam are measured from vacuum. In the case that Eam is much larger than 1.0 eV, the mean escape depth of secondary electrons with E0 (0 ≦ (E0-Φ-EF ≦ 1.5EF)) in metals can be expressed as: [34-35] λ(E0,metal)=2.0×108(E0-EF)1.3(EF5.57)0.45[0(E0-Φ-EF)1.5EF] (5) where E0 is measured from the bottom of the conduction band, and E0 is the sum of E and the energy obtained from primary electrons by scattering. The unit of length in this study is m, but the unit of length in Refs. [34, 35] is Å. Therefore, in this study, the magnitude of the formula coefficient in Refs. [34, 35] is 1010 times that in Eq. (5).

According to the energy band structures of metals, the fact that the electrons with E absorbing one hγ photon have (E+ hγ) (i.e., Eph) and the theories of photo-emission, we estimate that in the case that γ is farther away γ0 { i.e., γ > [(3.0 eV/h)+γ0] }, most of the photon-induced electrons in metals have Evac > 1.0 eV, and Emean is much larger than 1.0 eV, where γ0 is the threshold frequency. Thus, from the fact that SEE and photo-emission have common escape and transport mechanisms [6-7] and the fact that most secondary electrons in metals also have Evac > 1.0 eV and Eam is also much larger than 1.0 eV, it is known that the hγ photon-induced electrons with Eph that undergo photo-emission from metals farther than γ0 have the same transport mechanisms as do secondary electrons in metals. Further, the mean escape depth of hγ photon-induced electrons with Eph that undergo photo-emission from metals farther away than γ0 λ(Eph, hγ) has a similar expression as does Eq. (5). Therefore, according to Eq. (5) and the fact that the electrons with E absorbing one hγ photon have an Eph value that corresponds to E0, in the case where Emean is much larger than 1.0 eV, λ(Eph, hγ) can be written as: λ(Eph,hγ)=2.0×108(E+hγ-EF)1.3(EF5.57)0.45        =2.0×108(Eph-EF)1.3(EF5.57)0.45[0(Eph-Φ           -EF)1.5EF] (6) The probability that an internal secondary electron having E0 ≥ (Φ+EF) and reaching an emission surface passes over the surface barrier of a metal into a vacuum [34-36] is expressed as: P(E0)=1[(EF+Φ)/E0]0.5 (7)

From Eq. (7), the fact that photo-emission and SEE have common escape mechanisms [6-7] and the fact that E0 corresponds to Eph = E + , the probability that an internal photo-emitted electron with E absorbing one hγ photon, having Eph ≥ (Φ+EF) and reaching an emission surface passes over the surface barrier of metal can be written as [36-37]: P(Eph,hγ)=1[(EF+Φ)/(E+hγ)]0.5=1[(EF+Φ)/Eph]0.5 (8) Based on Eqs. (6) and (8), the probability that an internal photo-emitted electron with E, which absorbs one hγ photon and is excited at x, can reach an emission surface and pass over the surface can be written as: P(Eph,hγ,x)={1[(EF+Φ)/Eph]0.5}exλ(Eph,hγ) (9)

3

First SEE model for photo-emission

Based on the fact that SEE has a maximum escape depth that is five times the mean escape depth [34-35, 37], it is easy to understand that this is also applicable for photo-emitted electrons because both of them have common escape and transport mechanisms [6-7]. Thus, f(Eph, hγ) can be given as: f(Eph,hγ)=0(n(x)P(Eph,hγ,x))dx        =05λ(Eph,hγ){n(x)exλ(Eph,hγ)[1-(EF+ΦEph)0.5]}dx        =CγρNAg(Eph-hγ)N0λrealAα(1e5λ(Eph,hγ)λreal)[1-(EF+ΦEph)0.5]           [0(Eph-Φ-EF)1.5EF] (10) where λreal of Eq. (10) can be written as: λreal=λ(Eph,hγ)λγ/(λ(Eph,hγ)+λγ) (11)

Based on the energy band structures of metals shown in Fig. 1, Eq. (8), and the fact that the electrons with E absorbing one hγ photon have Eph = (E+hγ), it is known that in the case that N0 photons at γ < (EF+Eg)/h enter into metals, the electrons with E in the range of [(EF+Φ-hγ), (EF+Φ)] absorbing one photon have Eph in the range of [(EF+Φ), (EF+Φ+hγ)], and that the photo-emitted electrons with Eph in the range of [(EF+Φ), (EF+Φ+hγ)] may escape into the vacuum. Thus, from Eq. (10), it is known that in the case that No photons at γ < (EF+Eg)/h enter perpendicularly into metals, the number of photo-emitted electrons can be written as: Nelectrons=CγρNAAα(EF+Φ)(EF+Φ+hγ){N0g(Eph-hγ)λreal(1e5λ(Eph,hγ)λreal)[1-(EF+ΦEph)0.5]}dEph. (12) AQE(hγ) is defined as the number of photo-emitted electrons per absorbed photon [38-39]. Thus, from the definition of AQE(hγ), the fact that N0 photons at γ < (EF+Eg)/h are absorbed by metals and Eq. (12), the AQE() from metals induced by photons at γ < (EF+Eg)/h can be written as: AQE(hγ)=CγρNAAα(EF+Φ)(EF+Φ+hγ){g(Ephhγ)λreal(1e5λ(Eph,hγ)λreal)[1-(EF+ΦEph)0.5]}dEph. (13)

From Ref. 20, it is known that the g(E) (i.e., g(Eph-hγ)) of Au is as shown in Fig. 1 of Ref. 20, and that the s, EF, and Φ values of Au equal 11, 11.6 eV, and 4.9 eV, respectively. The Cγ value of Au calculated with parameters (hγ, NA, s, ρ = 1.93 × 107g/m3, Aα = 197 g/mol [40], g(Eph-hγ) [20], EF, Φ, n% and experimental AQE(hγ) [20] shown in Table 1) and Eqs. (2), (6), (11), and (13) are still shown in Table 1. The λγ value of Au calculated using Eq. (2) and parameters (s, NA, ρ, Aα, n%, and Cγ shown in Table 1) are also shown in Table 1. The values of f(Eph, ) (in arbitrary units) of Au are calculated with parameters (Eph, , g(Eph-hγ), EF, Φ, λγ, and Cγ, as shown in Table 1) and Eqs. (6), (10), and (11). The comparison between these calculated f(Eph, hγ) values of Au and the experimental ones [20] is shown in Fig. 2.

Fig. 2
Comparison between the f(Eph, ) values of Au calculated using Eq. (10) and experimentally obtained values.
pic

From Ref. 21, it is known that the g(Eph-hγ) value of Ni is as shown in Fig. 18 of Ref. 21, and that the s, EF, and Φ values of Ni equal 10, 6.0 eV, and 5.0 eV, respectively. The Cγ at ≦ 11.0 eV of Ni calculated with parameters (, NA, s, ρ = 8.9 × 106g/m3, Aα = 58.69 g/mol [40], g(Eph-hγ) [21], EF, Φ, n%, and AQE (hγ) [21] shown in Table 2) and Eqs. (2), (6), (11), and (13) are as shown in Table 2. The sum of EF and Φ of Ni is equal to 11.0 eV. Thus, from Figure 1, when we use parameters (hγ, NA, s, ρ, Aα, g(Eph-hγ), EF, Φ, n%, and experimental AQE() [21] shown in Table 2) and Eqs. (2), (6), (11), and (13) to calculate the value of Cγ at > 11.0 eV for Ni, the lower limit of the integral [i.e., (EF+Φ)] in Eq. (13) should be replaced with “”. The λγ of Ni calculated with Eq. (2) and parameters (s, NA, ρ, Aα, n%, and Cγ shown in Table 2) are also shown in Table 2. The f(Eph, ) value (in arbitrary units) of Ni calculated with corresponding parameters (Eph, hγ, g(Eph-hγ), EF, Φ, λγ, and Cγ shown in Table 2) and Eqs. (6), (10), and (11) are shown in Figure 3.

Fig.. 3
The f(Eph, hγ) values calculated using Eqs. (10) and Eq. (21) for Ni.
pic

Based on Eq. (12) and three-step processes of photo-emission, it is known that in the case where N0 photons at γ < (EF+Eg)/h enter perpendicularly into metals, the number of internal photo-emitted electrons reaching the surface can be written as: Nreach=CγρNAAα(EF+Φ)(EF+Φ+hγ)[N0g(Ephhγ)λreal(1e5λ(Eph,hγ)λreal)]dEph (14)

Based on Eqs. (6) and (12), it is known that in the case that No photons at γ < (EF+Eg)/h enter perpendicularly into metals, the total escape depth of photo-emitted electrons can be written as: Ndepth=CγρNAAα(EF+Φ)(EF+Φ+hγ){N0g(Ephhγ)λ(Eph,hγ)λreal(1e5λ(Eph,hγ)λreal)[1-(EF+ΦEph)0.5]}dEph (15)

According to Eq. (12) and the fact that the photo-emitted electrons with E absorbing one hγ photon have Evac = (Eph-EF-Φ), it is known that in the case that N0 photons at γ < (EF+Eg)/h enter perpendicularly into metals, the total Evac of photo-emitted electrons can be written as: Nenergy=CγρNAAα(EF+Φ)(EF+Φ+hγ){N0g(Ephhγ)(EphEFΦ)λreal(1e5λ(Eph,hγ)λreal)1-(EF+ΦEph)0.5}dEph (16)

Based on the definition of B and Eqs. (12) and (14), B can be expressed as: B=Nelectrons/Nreach (17)

From the definition of λ and Eqs. (12) and (15), λ can be written as: λ=Ndepth/Nelectrons (18)

Based on the definition of λ and Eqs. (12) and (16), Emean can be expressed as: Emean=Nenergy/Nelectrons (19)

The B values of Au and Ni are calculated using Eqs. (6), (11), (12), (14), and (17), and corresponding parameters (hγ, g(Eph-hγ), EF, Φ, λγ shown in Tables. 1-2), respectively; The λ values of Au and Ni are calculated using Eqs. (6), (11), (12), (15), and (18), and corresponding parameters (hγ, g(Eph-hγ), EF, Φ, λγ shown in Tables 1 and 2. The Emean values of Au and Ni are calculated using Eqs. (6), (11), (12), (16), and (19), and corresponding parameters (hγ, g(Eph-hγ), EF, Φ, λγ shown in Tables 1 and 2. These calculated B, λ, and Emean values of Au and Ni are shown in Tables 1 and 2.

The sum of the EF and Φ values of Ni is equal to 11.0 eV [21]. Thus, in the case that photons at hγ >11.0 eV enter Ni, the electrons in the conduction band absorbing one photon at least have Eph= . Therefore, when we use Eqs. (12) and (14)-(19) to calculate the corresponding parameters (B, λ and Emean) at > 11.0 eV for Ni, the lower limit of the integral in Eqs. (12) and (14)-(16) should be replaced with “” These calculated B, λ and Emean values of Ni are shown in Table 2.

From the energy band structures of metal shown in Figure 1, the law of energy conservation, the relation of Eph=E +, and the courses of deducing Eqs. (12)-(16), it is known that in the case that hγ is within the range of ((EF+ Φ), (EF+Eg)), the lower limit of the integral in Eqs. (12)-(16) should be replaced with “”.

4

Second SEE model for photo-emission

From the above courses of calculating Cγ with Eqs. (2), (6), (11), and (13), it is known that in the cases that the AQE() or absolute g(Eph-hγ) values are not known, Cγ cannot be calculated using Eqs. (2), (6), (11), and (13). From the above courses of calculating λγ, f(Eph, ), B, λ and Emean, it is also known that λγ, f(Eph, hγ), B, λ, and Emean can be calculated by the first SEE model for photo-emission on the basis of the known Cγ. Thus, in the case that AQE(hγ) or the absolute g(Eph-hγ) value is not known, λγ, f(Eph, ), B, λ, and Emean cannot be calculated by the first SEE model either. Therefore, we present the following second SEE model for f(Eph, ), Cγ, λγ, B, λ, and Emean of metals; in the case that both AQE() and the absolute g(Eph-hγ) values are not known, f(Eph, ), B, λ, and Emean can still be calculated by the second SEE model. In the case that the absolute g(Eph-hγ) value is not known, Cγ and λγ can still be calculated by the second SEE model.

Suppose that in the case that No photons at γ < (EF+Eg)/h enter perpendicularly into metals, the number of photons at x does not decrease with increasing x, and equals No. Thus, based on Eq. (3), the above assumption, and the fact that the PCS at a given γ of the electron in the conduction band of a given metal can be considered as a constant Cγ, in the case that No photons at γ < (EF+Eg)/h enter into metals, the number of internal photo-emitted electrons per unit path length of incident photons can be written as: n(x)=CγG(Ephhγ)N0=CγρNAg(Ephhγ)N0Aα[0(Eph-Φ-EF)] (20)

Therefore, from the three-step processes of photo-emission, the conclusion that the maximum escape depth of internal photo-emitted electrons with Eph equals 5.0 λ(Eph, hγ) and Eqs. (9) and (20), f(Eph, hγ) can be expressed as: f(Eph,hγ)=05λ(Eph,hγ){CγρNAg(Ephhγ)N0Aαexλ(Eph,hγ)[1-(EF+ΦEph)0.5]}dx=CγρNAg(Ephhγ)N0λ(Eph,hγ)Aα(1e5)[1-(EF+ΦEph)0.5][0[Eph-Φ-EF]1.5EF] (21)

The f(Eph, hγ) (in arbitrary units) values of Au are calculated with corresponding parameters (Eph, hγ, g(Eph-hγ) [20], EF, Φ) and Eqs. (6) and (21). The comparison between these calculated f(Eph, hγ) values of Au and experimental ones [20] are shown in Fig. 4. The f(Eph, hγ) value (in arbitrary units) of Ni calculated using corresponding parameters (Eph, , g(Eph-) [21], EF, Φ) and Eqs. (6) and (21) are also shown in Fig. 3. From Ref. 25, it is known that the g(Eph-) value (in arbitrary units) of Cu is shown in Figure 4 of Ref. 25, and that the EF, s, and Φ values of Cu equal 12.0 eV, 11, and 4.5 eV, respectively. The f(Eph, ) values (in arbitrary units) of Cu are calculated with corresponding parameters (Eph, , g(Eph-) [25], EF, Φ) and Eqs. (6) and (21). Comparisons between these calculated f(Eph, ) of Cu and corresponding experimental ones [25] are shown in Fig. 5.

Fig. 4
Comparisons between the f(Eph, ) values of Au calculated using Eq. (21) and experimental ones.
pic
Fig. 5
Comparisons between the f(Eph, ) values of Cu calculated using Eq. (21) and experimental ones.
pic

In the case that N0 photons at γ < (EF+Eg)/h enter into metals, the electrons with E in the range of [(EF+Φ-hγ), (EF+Φ)] absorbing one hγ photon have Eph in the range of [(EF+Φ), (EF+Φ+hγ)], and the photo-emitted electrons with Eph in the range of [(EF+Φ), (EF+Φ+hγ)] may escape into vacuum. Thus, from Eq. (21), it is known that in the case that N0 photons at γ < (EF+Eg)/h enter perpendicularly into metals, the number of photo-emitted electrons can be written as: Nelectrons1=CγρNAAα(EF+Φ)(EF+Φ+hγ){N0g(Ephhγ)λ(Eph,hγ)(1e5)[1-(EF+ΦEph)0.5]}dEph. (22)

Eqs. (21)-(22) are deduced on the basis of the assumption that the number of photons at any x equals N0, but in fact, the number of photons at x decreases with increasing x. Thus, from the characteristics of electron emission and the prerequisite of deducing Eq. (22), it is known that in the case that N0 photons at γ < (EF+Eg)/h enter perpendicularly into metals, the real number of photo-emitted electrons is less than the value of Eq. (22), and should be written as: Nelectrons2=K(γ)CγρNAAα(EF+Φ)(EF+Φ+hγ){N0g(Ephhγ)λ(Eph,hγ)(1e5)[1-(EF+ΦEph)0.5]}dEph. (23)

For a given γ and metal, K(γ) is a constant that is less than 1.0.

According to Eq. (23) and the three-step processes of photo-emission, it is known that in the case that N0 photons at γ < (EF+Eg)/h enter perpendicularly into metals, the number of internal photo-excited electrons reaching the emission surface can be written as: Nreach2=K(γ)CγρNAAα(EF+Φ)(EF+Φ+hγ)[N0g(Ephhγ)λ(Eph,hγ)(1e5)]dEph. (24)

Based on Eqs. (6) and (23), it is known that in the case that N0 photons at γ < (EF+Eg)/h enter perpendicularly into metals, the total escape depth of photo-emitted electrons can be written as: Ndepth2=K(γ)CγρNAAα(EF+Φ)(EF+Φ+hγ){N0g(Ephhγ)(λ(Eph,hγ))2(1e5)[1-(EF+ΦEph)0.5]}dEph. (25)

According to the fact that the photo-emitted electrons with E have Evac=(Eph-EF-Φ) and Eq. (23), it is known that in the case that N0 photons at γ < (EF+Eg)/h enter perpendicularly into metals, the total Evac of photo-emitted electrons can be written as: Nenergy2=K(γ)CγρNAAα(EF+Φ)(EF+Φ+hγ){N0g(Ephhγ)(EphEFΦ)λ(Eph,hγ)(1e5)[1-(EF+ΦEph)0.5]}dEph. (26)

Based on the definition of B and Eqs. (23) and (24), B can be expressed as: B=Nelectrons2/Nreach2 (27)

Based on the definition of λ and Eqs. (23) and (25), λ can be written as: λ=Ndepth2/Nelectrons2 (28)

Based on the definition of λ and Eqs. (23) and (26), Emean can be expressed as: Emean=Nenergy2/Nelectrons2 (29)

The B values of Au calculated with parameters of Au (hγ, g(Eph-hγ), EF and Φ) and Eqs. (6), (23), (24), and (27) are shown in Table 3. The λ values of Au calculated with parameters of Au (hγ, g(Eph-hγ), EF and Φ) and Eqs. (6), (23), (25) and (28) are shown in Table 3. The Emean values of Au calculated with parameters of Au (, g(Eph-), EF and Φ) and Eqs. (6), (23), (26) and (29) are shown in Table 3. Using the same method, the B, λ, and Emean values of Ni and Cu are calculated and shown in Tables 4 and 5, respectively.

Table 3
The parameters of Au calculated using the second SEE model.
M hγ(eV) Cγ(10-23m2) λγ(10-9m) λ (10-9m) B Emean(eV)
7.4 45 4.24 2.61 0.0231 1.35
7.7 45.5 4.01 2.58 0.0224 1.42
7.9 48 3.70 2.58 0.0219 1.45
8.1 48.4 3.59 2.58 0.0223 1.46
8.7 49.1 3.34 2.53 0.0262 1.58
9.0 51.2 3.15 2.48 0.0285 1.67
9.2 55.1 2.89 2.45 0.0303 1.74
10.4 53.0 2.92 2.19 0.0459 2.35
10.7 59.4 2.61 2.13 0.0485 2.52
11.0 64.9 2.38 2.07 0.0503 2.69
11.2 66.3 2.33 2.04 0.0515 2.79
11.5 67.6 2.28 2.0 0.0533 2.95
Show more
Table 4
The parameters of Ni calculated using the second SEE model.
hγ(eV) Cγ(10-23m2) λγ (10-9m) λ (10-9m) B Emean(eV)
7.6 12.2 9.01 1.74 0.0512 1.81
8.0 18.3 2.99 1.68 0.0569 2.03
8.6 22.2 4.95 1.59 0.0648 2.35
9.2 27.8 3.94 1.52 0.0683 2.65
9.8 30.8 3.56 1.48 0.0676 2.88
10.4 45.1 2.43 1.46 0.0720 3.06
11.0 46.1 2.38 1.4 0.0847 3.31
11.6 36.2 3.03 1.32 0.106 3.69
Show more

As is done for the first SEE model, the lower limit of the integral in Eqs. (23)-(26) should be replaced with "" when calculating the corresponding parameters (B, λ and Emean) at >11.0 eV for Ni.

According to the simple theories of transport and escape of internal secondary electrons, the probability that an internal secondary electron, which is excited at x, can reach the emission surface and pass over the surface barrier of a metal into vacuum can be written as [41-44]: f(x)s=Bsex/λs, (30)

where Bs is the the mean probability that an internal secondary electron escapes into vacuum upon reaching the emission surface, and λs is the mean escape depth of secondary electrons.

Based on Eq. (30) and the fact that SEEs and photo-emission have common mechanisms of transport and escape [6-7], similarly, the probability that an internal photo-emitted electron, which is excited at x, can reach the emission surface and pass over the surface barrier of metal can be written as: f(x)ph=Be-x/λ. (31)

Thus, according to the three-step processes of photo-emission and Eqs. (4) and (31), it is known that in the case that No photons at γ < (EF+Eg)/h enter perpendicularly into metals, the number of photo-emitted electrons can be written as: Nelectrons=0(n(x)f(x)ph)dx=N0αphγB0[e[(αγ+1λ)x]]dx=N0Bλαphγ1+λαγ (32)

Therefore, from Eq. (32) and the definition of AQE(), the AQE() can be written as: AQE(hγ)=Bλαphγ1+λαγ (33)

Based on the energy band structures of metal shown in Fig. 1, the calculated g(E), the values of EF and Φ, the law of energy conservation, and the fact that γ is < (EF+Eg)/h, we can calculate the relative number of electrons in the conduction band of a metal which may absorb one photon and become internal photo-emitted electrons. For example, when the photons at = 7.4 eV enter into Au with EF = 11.6 eV and Φ =4.9 eV, it is known that the electrons absorbing one photon and having E ≧ [EF-(7.4eV-Φ)] (i.e., 9.1 eV) may have enough energy to become internal photo-emitted electrons. Thus, based on the g(E) value of Au, the fact that the electrons with E ≧ 9.1 eV may become internal photo-emitted electrons and the fact that the EF and Φ values of Au equal 11.6 eV and 4.9 eV, respectively, we can calculate the m% electrons in the conduction band of Au which may absorb one photon and become internal photo-emitted electrons by calculating, and the calculated m% at = 7.4 eV of Au equals 0.0734. Using the same method, the m% at different values of Au, Ni, and Cu can be calculated, and are shown in Tables 1, 2, and 5, respectively. Therefore, from the definition of αphγ and the fact that the probability that the electron in the conduction band of a given metal absorbs one photon at a given γ can be considered as a constant Cγ, in the case that photons at γ < (EF+Eg)/h enter perpendicularly into metals, the αphγ value of Eq. (33) can be expressed as: αphγ=(sρNACγm%)/Aα (34)

Note that in the case that photons at γ < (EF+Eg)/h enter perpendicularly into metals, the αγ value of Eq. (33) is expressed as Eq. (2).

αγ of NEAS equals αphγ [22-24]. Thus, from Eq. (33), AQE(hγ) from NEAS can be written as: AQE(hγ)=Bλαγ1+λαγ. (35)

It is well known that excited electrons (including electron-induced electrons, ion-induced electrons, and photo-excited electrons) with different E values have different values of mean escape depth and mean escape probability [6-7, 13, 26, 32-37, 45]. Thus, from the physical mechanisms of transport and escape of excited electrons, it is known that the process that Eqs. (30)-(31) use to express f(x) in the courses of deducing some formulas [41-44] is an approximate process; where f(x) is the probability that an electron excited at x escapes into a vacuum. In other words, there is the approximation that Eq. (31) is used to express f(x)ph made in the courses of deducing Eq. (33). Eq. (6) is derived from Eq. (5), which is correct [34-35] in the case that Eam is much larger than 1.0 eV, and Eq. (8) and Eq. (31) are derived from Eq. (7) [36-37] and Eq. (30) [41-44], which are also correct. Thus, Eqs. (6), (8), and (31) are correct. Therefore, from the fact there is an approximation made while deducing Eq. (33) and Eqs. (13) and (33), it can be concluded that Eq. (13) in the case that Emean is much larger than 1.0 eV and (32) is theoretically correct, and that Eq. (13) in the case that Emean is much larger than 1.0 eV is more accurate than Eq. (33).

Some authors assumed that the negative electron affinity photo-emission process can be described by a diffusion model in which AQE(hγ) from NEAS can be expressed as Eq. (35) [22-24], and they successfully used Eq. (35) to analyze the parameters of the negative electron affinity photo-emission [22-24]. That is, Eq. (35) has been experimentally proven. Thus, from deducing Eqs. (33) and Eq. (35), the conclusion that Eq. (33) is theoretically correct and the relation between Eq. (33) and Eq. (35), it can be concluded that Eq. (33) is further proven to be correct.

5

Results and discussion

It can be seen from Figure 2 that the calculated f(Eph, ) values of Au agree well with the experimental ones [20] at = 8.1-11.6 eV, but not at = 7.4-7.9 eV. It can also be seen from Fig. 3 and the calculated f(Eph, ) value of Ni in Fig. 13 of Ref. [21] that both calculations of Ni are in good agreement at = 9.2-11.6 eV, but not at = 7.6-8.6 eV. Thus, it can be concluded that Eq. (10) can be used to express the f(Eph, ) from Au at hγ = 8.1-11.6 eV and Ni at hγ = 9.2-11.6 eV, and that Eq. (10) can at least express the relative number of photo-emitted electrons with Eph in the cases that N0 photons at hγ = 8.1-11.6 eV enter into Au and that N0 photons at hγ = 9.2-11.6 eV enter into Ni. Therefore, according to the relation between Eq. (10) and Eqs. (12)-(16), it is concluded that Eqs. (12)- (16) can at least be used to express the relative values of Nelectrons, AQE(), Nreach, Ndepth, and Nenergy from Au at = 8.1-11.6 eV and Ni at = 9.2-11.6 eV. Then, from Eqs. (17)-(19), it can be concluded that Eqs. (17)-(19) can be used to calculate the B, λ, and Emean values of Au at = 8.1-11.6 eV and Ni at = 9.2-11.6 eV, respectively. That is, the B, λ, and Emean values of Au at = 8.1-11.5 eV and Ni at = 9.2-11.6 eV calculated with Eqs. (17)-(19) and shown in Tables 1 and 2 are correct.

The AQE() values from Au and Ni are calculated using Eqs. (2), (33), and (34) as well as corresponding parameters (s, NA, ρ, Aα, B, λ, Cγ calculated using Eq. (13), m%, and n% shown in Tables 1 and 2). Further, the calculated AQE() values from Au and Ni are shown in Tables 1 and 2. From Tables 1 and 2, it is known that the calculated AQE() from Au at = 7.4-11.5 eV and Ni at = 7.6-11.6 eV are in agreement with the corresponding experimental ones [20-21]. Thus, from the conclusions that the B and λ of Au at = 8.1-11.5 eV and Ni at = 9.2-11.6 eV calculated with Eqs. (17)-(18) are correct, and the conclusion that Eq. (33) is correct, it can be concluded that the Cγ values of Au at = 8.1-11.5 eV and Ni at =9.2-11.6 eV calculated with Eq. (13) are correct. Therefore, from the conclusions that Eq. (13) can at least be used to express the relative values of AQE(hγ) from Au at = 8.1-11.5 eV and Ni at =9.2-11.6 eV, it can be concluded that Eq. (13) can also be used to express the absolute values of AQE() from Au at = 8.1-11.5 eV and Ni at = 9.2-11.6 eV. From the conclusions that the Cγ values of Au at = 8.1-11.5 eV and Ni at =9.2-11.6 eV calculated with Eq. (13) are correct, and the fact that the λγ values of Au and Ni are calculated with Eq. (2) and corresponding Cγ calculated with Eq. (13), it can be concluded that the λγ values of Au at = 8.1-11.5 eV and Ni at = 9.2-11.6 eV calculated with Eq. (2) are also correct.

From the conclusion that the Cγ values of Ni at = 9.2-11.6 eV calculated with Eq. (13) are correct and the fact that the λγ values of Ni are calculated with Eq. (2) and the Cγ values of Ni calculated with Eq. (13), it can be concluded that the λγ of Ni at = 9.2-11.6 eV calculated with Eq. (2) are also correct. From the comparison between the calculated AQE() from Au at = 8.1-11.5 eV and AQE() from Ni at = 9.2-11.6 eV shown in Tables 1-2 and experimental ones [20-21] shown in Tables 1-2, it is known that the relative differences between the calculated AQE() and experimental ones [20-21] are within the range of 5-15%. From the conclusion that Eq. (13) is more accurate than Eq. (33), it can be assumed that the differences between experimental AQE(hγ) and ones calculated with Eq. (33) and Cγ calculated with Eq. (13) mainly result from the approximation of Eq. (33). Therefore, the errors in the Cγ values of metals calculated with Eq. (13) can be estimated to be 5%.

It can be seen from Fig. 4 that the calculated f(Eph, ) values of Au agree well with experimental ones [20] at = 8.1-11.6 eV, but not at hγ = 7.4-7.9 eV. It can also be seen from Fig. 3 and the calculated f(Eph, ) of Ni in Fig. 13 of Ref. [21], it is known that both the f(Eph, hγ) of Ni calculated in Ref. 21 and the f(Eph, hγ) of Ni calculated with Eq. (21) are in good agreement at =9.2-11.6 eV but not at = 7.6-8.6 eV. Thus, it can be concluded that Eq. (21) can be used to express the f(Eph, ) from Au at = 8.1-11.6 eV and Ni at = 9.2-11.6 eV, and that Eq. (21) can be used to express the relative number of photo-emitted electrons with Eph in the cases that photons at hγ = 8.1-11.6 eV enter into Au and that photons at hγ = 9.2-11.6eV enter into Ni. Therefore, from the relation between Eq. (21) and Eqs. (23)-(26), it can be concluded that Eqs. (23)-(26) can be used to express the relative values of Nelectrons2, Nreach2, Ndepth2, and Nenergy2 from Au at = 8.1-11.6 eV and Ni at = 9.2-11.6 eV. Then, from deducing Eqs. (27)-(29), it is determined that Eqs. (27)-(29) can be used to calculate the B, λ, and Emean values of Au at = 8.1-11.6 eV and Ni at = 9.2-11.6 eV. That is, the B, λ and Emean values of Au at = 8.1-11.5 eV and Ni at = 9.2-11.6 eV calculated from Eqs. (27)-(29) and shown in Tables 3 and 4 are correct.

The Cγ values of Au calculated with Eqs. (2), (33), and (34), s=11, NA, ρ, Aα, parameters (m%, n%, experimental AQE () [20] shown in Table 1 and parameters (B, λ) shown in Table 3 are as shown in Table 3; the λγ values of Au calculated with Eq. (2), s=11, NA, ρ, Aα, Cγ shown in Table 3 and n% shown in Table 1 are shown in Table 3. The Cγ values of Ni calculated with Eqs. (2), (33), and (34), s=10, NA, ρ, Aα, parameters (m%, n%, experimental AQE() [21]) shown in Table 2 and parameters (B, λ) shown in Table 4 are shown in Table 4; the λγ values of Ni calculated with Eq. (2), s=10, NA, ρ, Aα, Cγ shown in Table 4 and n% shown in Table 2 are shown in Table 4. According to the conclusion that the B and λ values of Au at = 8.1-11.5 eV shown in Table 3 and the B and λ of Ni at = 9.2-11.6 eV shown in Table 4 are correct and the fact that Eq. (33) is correct, it is determined that the Cγ values at = 8.1-11.5 eV for Au shown in Table 3 and the Cγ at = 9.2-11.6 eV of Ni shown in Table 4, which are calculated with Eq. (33), are reasonable. From the estimation that errors in the Cγ values of Au shown in Table 1 are about 5% and the comparison between Cγ at = 8.1-11.5 eV for Au shown in Table 3 and those in Table 1, it can be estimated that the errors in Cγ at = 8.1-11.5 eV for Au calculated using Eq. (33) and shown in Table 3 are about 20%. Based on the estimation that the errors in Cγ for Ni shown in Table 2 are about 5%, and the comparison between Cγ at = 9.2-11.6 eV for Ni shown in Table 4 and those shown in Table 2, it can be estimated that the errors in Cγ at = 9.2-11.6 eV for Ni calculated using Eq. (33) and shown in Table 4 are about 30%.

It can be seen from Fig. 5 that the calculated f(Eph, ) values of Cu are in good agreement with experimental ones [25] at =7.7-11.6 eV, but not at = 6.8 eV. Thus, it is concluded that Eq. (21) can be used to express the f(Eph, ) values from Cu at hγ = 7.7-11.6 eV. Therefore, from the relation between Eq. (21) and Eqs. (23)-(26), it can be concluded that Eqs. (23)-(26) can at least be used to express the relative values of Nelectrons2, Nreach2, Ndepth2, and Nenergy2 from Cu at = 7.7-11.6 eV. Then, from determining Eqs. (27)-(29), it can be concluded that Eqs. (27)-(29) can be used to calculate the B, λ, and Emean values of Cu at = 7.7-11.6 eV. That is, the B, λ, and Emean values of Cu at =7.7-11.6 eV calculated using Eqs. (27)-(29) and shown in Table 5 are correct.

The Cγ values of Cu calculated with Eqs. (2), (33), and (34), s=11, NA, ρ, Aα, parameters (m%, n%, experimental AQE (hγ) [25], B, λ) are shown in Table 5. The λγ value of Cu calculated with Eq. (2), s =11, NA, ρ, Aα, Cγ shown in Table 5 and n% shown in Table 5 are also shown in Table 5. From the conclusion that the B and λ values of Cu at = 7.7-11.6 eV shown in Table 5 are correct and the fact that Eq. (33) is correct, it can be concluded that the Cγ values at = 7.7-11.6 eV of Cu calculated using Eq. (33) and shown in Table 5 are reasonable. There is no Cγ at = 7.7-11.6 eV for Cu calculated by other authors or using other current methods. Thus, we cannot estimate the errors in Cγ at = 7.7-11.6 eV for Cu calculated using Eq. (33). The relative differences among the Cγ values at hγ < 50 eV obtained by different authors can reach about 200% or more [19]. Thus, from the estimations that the errors in Cγ at = 8.1-11.5 eV for Au shown in Table 3 are about 20%, and that the errors in Cγ at = 9.2-11.6 eV for Ni shown in Table 4 are about 30%, it can be concluded that the method of calculating Cγ for metals using Eq. (33) is more accurate. According to the estimation that the errors in Cγ for metals calculated using Eq. (13) are about 5%, it can be concluded that the method of calculating Cγ for metals using Eq. (13) is very accurate. From the perspective of accuracy of the calculated Cγ, it appears that the method of calculating Cγ with Eq. (13) presented in the first SEE model is better than that of calculating Cγ with Eq. (33) presented in the second SEE model. However, it is important to note that in the case that the absolute g(Eph-) is not known, the method of calculating the Cγ value for metals using Eq. (13) cannot be used to calculate Cγ, but the method of calculating the Cγ value for metals using Eq. (33) can be used to calculate Cγ. For example, because only the relative g(Eph-) value of Cu is known in this study [25], the Cγ value at = 7.7-11.6 eV for Cu can only be calculated using the method of calculating the Cγ value for metals with Eq. (33). It is also important to note that in the cases that AQE() are not known, the first SEE model cannot be used to calculate f(Eph, ), B, λ, and Emean, but the second SEE model can be used to do so.

From the comparison between Fig. 2 and Fig. 4 and the comparison between the f(Eph, ) values of Ni calculated with Eq. (10) and those calculated with Eq. (21) in Fig. 3, it is known that the differences between f(Eph, ) values for Au and Ni calculated with Eq. (10) and those calculated with Eq. (21) are very small. From Tables 1, 2, 3, 4, it is seen that the B, λ, and Emean values of Au and Ni calculated with Eqs. (17)-(19) are approximately equal to those calculated with Eqs. (27)-(29). That is, Eqs. (9) and (17)-(19) deduced in the first SEE model can be replaced with Eqs. (20) and (27)-(29) deduced in the second SEE model, respectively, and vice versa. From the above comparison among f(Eph, ), B, λ, and Emean for Au and Ni, and the courses of calculating f(Eph, ), B, λ, and Emean for Au, Cu, and Ni, we found that the values of Cγ have little influence on the shape of f(Eph, ) and the values of B, λ, and Emean, but that both g(Eph-) and significantly influence them. For example, the shape of g(Eph-) significantly influences the shape of f(Eph, ).

The excited electrons with Evac<1.0 eV lose energy mainly by multiple electron-phonon scattering [13, 37, 45-46]. Electron-phonon scattering loses less energy every time there is scattering, and the excited electrons with Evac<1.0 eV may still become emitted electrons after several occurrences of electron-phonon scattering [13, 37, 45-46]. Thus, if the excited electrons with Evac<1.0 eV have more energy, they can travel a greater distance to escape into vacuum. Therefore, the mean escape depth of the excited electrons with Evac<1.0 eV is proportional to Evac[13, 37, 45-46]. However, the excited electrons with Evac values that are much larger than 1.0 eV lose energy mainly by single electron-electron scattering. Electron-electron scattering results in the loss of a larger amount energy at every scattering, and the excited electrons with Evac values much larger than 1.0 eV almost cannot become emitted electrons after single electron-electron scattering [13, 37, 45-46]. The probability that an excited electrons with Evac much larger than 1.0 eV undergoes single electron-electron scattering per unit path length of excited electron is proportional to Evac [13, 37, 45-46]. Thus, the mean escape depth of the excited electrons with Evac much larger than 1.0 eV is inversely proportional to Evac. Most secondary electrons have energy Evac >1.0 eV [32-33], and Eam is much larger than 1.0 eV, and the secondary electrons lose energy mainly by single electron-electron scattering. Thus, λs is inversely proportional to Evac, and the mean escape depth of secondary electrons with E0(0≦(E0-Φ-EF≦1.5EF) can be expressed as Eq. (5). In other words, Eq. (5) is correct in the case that the Eam is much larger than 1.0 eV. Therefore, from the fact that Eq. (6) is derived from Eq. (5), it can be concluded that Eq. (6) is correct in the case that Emean is much larger than 1.0 eV. Then, it is concluded that Eqs. (10), (17)-(19), (21), and (27)-(29) derived from Eq. (6) are also correct in the case that Emean is much larger than 1.0 eV. From Tables 1, 2, 3, 4, 5, it can be seen that the Emean of Au at hγ=8.1-11.5 eV, Ni at hγ=9.2-11.6 eV and Cu at hγ=7.7-11.6 eV are much larger than 1.0 eV. For this reason, f(Eph, ) calculated here for Au at hγ=8.1-11.6 eV, Ni at hγ=9.2-11.6 eV, and Cu at hγ=7.7-11.6 eV are in good agreement with the corresponding experimental ones and the ones calculated by other authors [20-21, 25], and the B, λ, and Cγ values calculated here for Au at hγ =8.1-11.5 eV, Ni at hγ = 9.2-11.6 eV and Cu at hγ = 7.7-11.6 eV are correct.

If the metal surfaces are contaminated or if metals have some impurities, the photo-emission from these metals becomes more complex. Thus, it is important to note that we must use experimental f(Eph, ) and AQE() values of clean and pure metals to investigate the corresponding f(Eph, ), Emean, B, λ and Cγ in this work, and that the experimental f(Eph, ) and AQE() used in this work are those of three clean and pure metals [20-21, 25]. In other words, the two SEE models presented in this work are only suitable for photo-emission from clean and pure metals in the vacuum ultraviolet.

6

Conclusion

In this study, Eqs. (10) and (21) for f(Eph, ) from metals have been deduced and proven to be correct for the cases of Au at = 8.1-11.6 eV and Ni at =9.2-11.6 eV, respectively; Thus, from the relation between Eq. (10) and Eqs. (12)-(16) as well as the relation between Eq. (21) and Eqs. (23)-(26), it is concluded that Eqs. (12)-(16) can at least be used to express the corresponding relative values of Nelectrons, AQE(), Nreach, Ndepth and Nenergy, respectively; and that Eqs. (23)-(26) can be used to express the corresponding relative values of Nelectrons2, Nreach2, Ndepth2 and Nenergy2, respectively. Therefore, from determining Eqs. (17)-(19) and (27)-(29), it can be concluded that Eqs. (17)-(19) and Eqs. (27)-(29) can be used to calculate the B, λ, and Emean values for Au at = 8.1-11.5 eV and Ni at hγ = 9.2-11.6 eV.

The AQE(hγ) value from Au at =7.4-11.5 eV and Ni at =7.6-11.6 eV are calculated using Eqs. (2), (33), and (34), the B and λ values for Au and Ni calculated with Eqs. (17)-(18), and the Cγ values for Au and Ni calculated using Eq. (13). These calculated AQE() values from Au and Ni agree well with the corresponding experimental ones. Thus, from the conclusions that the B and λ values of Au at =8.1-11.5 eV and Ni at =7.6-11.6 eV calculated with Eqs. (17)-(18) are correct and the conclusion that Eq. (33) is correct, it can be concluded that the Cγ values of Au at =8.1-11.5 eV and Ni at =7.6-11.6 eV calculated with Eq. (13) are correct. Therefore, from the conclusions that Eq. (13) can at least be used to express the relative values of AQE() from Au at =8.1-11.5 eV and Ni at =7.6-11.6 eV, it can be concluded that Eq. (13) can be used to express the absolute values of AQE() from Au at =8.1-11.5 eV and Ni at =7.6-11.6 eV.

The Cγ values of Au are calculated using Eqs. (2), (33), and (34), s=11, NA, ρ, Aα, parameters (m%, n%, experimental AQE ()) shown in Table 1 and parameters (B, λ) shown in Table 3, the Cγ of Ni values are calculated using Eqs. (2), (33), and (34), s=10, NA, ρ, Aα, parameters (m%, n%, experimental AQE ()) shown in Table 2 and parameters (B, λ) shown in Table 4. According to the conclusion that the B and λ values for Au at = 8.1-11.5 eV shown in Table. 3 and the B and λ values for Ni at = 9.2-11.6 eV shown in Table 4 are correct and the fact that Eq. (33) is correct, it can be concluded that the Cγ values for Au at = 8.1-11.5 eV and Ni at = 9.2-11.6 eV calculated using Eq. (33) are reasonable. From the comparison between the Cγ values for Au at = 8.1-11.5 eV for Au calculated with Eq. (33) and the corresponding ones shown in Table 1, it can be estimated that the errors in the Cγ at = 8.1-11.5 eV for Au calculated with Eq. (33) are about 20%. Based on the comparison between the Cγ values for Ni at = 9.2-11.6 eV for Ni calculated with Eq. (33) and corresponding ones shown in Table 2, it can be estimated that the errors in Cγ at = 9.2-11.6 eV for Ni calculated with Eq. (33) are about 30%.

Eq. (21) for the f(Eph, ) at =7.7-11.6 eV of Cu has been experimentally proven. Thus, from the relation between Eq. (20) and Eqs. (23)-(26), it is concluded that Eqs. (23)-(26) can be used to calculate the relative values of Nelectrons2, Nreach2, Ndepth2, and Nenergy2 from Cu at = 7.7-11.6 eV. Therefore, from determining Eqs. (27)-(29), it can be concluded that Eqs. (27)-(29) can be used to calculate B, λ, and Emean values for Cu at = 7.7-11.6 eV.

The Cγ values for Cu are calculated using Eqs. (2), (33), and (34), s=11, NA, ρ, Aα, parameters (m%, n%, experimental AQE()) shown in Table 5, B and λ calculated with Eqs. (27)-(28). From the conclusion that the B and λ values for Cu at = 7.7-11.6 eV calculated with Eqs. (27)-(28) are correct and the fact that Eq. (33) is correct, it can be concluded that the Cγ values at = 7.7-11.6 eV for Cu calculated using Eq. (33) are reasonable. The relative differences among the Cγ values at hγ<50 eV obtained by different authors can reach about 200% or more [19]. Thus, from the estimations that the errors in Cγ for Au at hγ= 8.1-11.5 eV and Ni at = 9.2-11.6 eV calculated using Eq. (33) are about 20% and 30%, it can be concluded that the method of calculating Cγ for metals using Eq. (33) is more accurate. From the estimation that the errors in Cγ for metals calculated using Eq. (13) are about 5%, it can be concluded that the method of calculating Cγ for metals using Eq. (13) is very accurate.

References
[1] X. D. Su, G. L. Zhang, S. P. Xu et al.,

Attenuation coefficients of gamma and X-rays passing through six materials

. Nucl. Sci. Tech. 31, 3 (2020).doi: 10.1007/s41365-019-0717-9
Baidu ScholarGoogle Scholar
[2] B. Lv, Y. Liu, W. Wu et al.,

Local large temperature difference and ultra-wideband photothermoelectric response of the silver nanostructure film/carbon nanotube film heterostructure

. Nat. Commun. 13, 1835 (2022). doi: 10.1038/s41467-022-29455-6
Baidu ScholarGoogle Scholar
[3] H. W. Yu, Y. X. Zhang, X. H. Chen, et al.,

Numerical simulation and method study of X-ray litho-density logging

. Nucl. Sci. Tech. 31(12), 124. (2020). doi: 10.1007/s41365-020-00826-2
Baidu ScholarGoogle Scholar
[4] D. Y. Lin, Y. T. Shih, W. C. Tseng et al.,

Influence of Mn, Fe, Co, and Cu Doping on the Photoelectric Properties of 1T HfS 2 Crystals

. Materials 15, 173 (2022). doi: 10.3390/ma15010173
Baidu ScholarGoogle Scholar
[5] Y. Lei, B. Du, P. Du, et al.,

The effects of Se/S ratio on the photoelectric properties of nitrogen -doped graphene quantum dots decorated CdSxSe1-x composites

. Ceram. Int. 48, 5280-5288 (2022). doi: 10.1016/j.ceramint.2021.11.071
Baidu ScholarGoogle Scholar
[6] J. Cazaux,

Correlation between the X-ray induced and the electron-induced electron emission yields of insulators

. J. Appl. Phys. 89, 8265-8272 (2001). doi: 10.1063/1.1368867
Baidu ScholarGoogle Scholar
[7] J. Cazaux,

Electron and X-ray-induced electron emissions from insulators

. Polym. Int. 50, 748-755 (2001). doi: 10.1002/pi.650
Baidu ScholarGoogle Scholar
[8] Y. Zhang, J. Zhao, H. Wang, et al.,

Single-atom Cu anchored catalysts for photocatalytic renewable H 2 production with a quantum efficiency of 56

. Nat. Commun. 13, 58 (2022). doi: 10.1038/s41467-021-27698-3
Baidu ScholarGoogle Scholar
[9] N. Q. Cai, G. Q. Zhang, C. B. Fu,

et al. Populating 229mTh via two-photon electronic bridge mechanism

. Nucl. Sci. Tech. 32(6), 59 (2021). doi: 10.1007/s41365-021-00900-3
Baidu ScholarGoogle Scholar
[10] R. Jiang, X. Wu, H. Liu et al.,

High-Performance Orange-Red Organic Light-Emitting Diodes with External Quantum Efficiencies Reaching 33.5% based on Carbonyl-Containing Delayed Fluorescence Molecules

. Adv. Sci. 9, 2104435 (2022). doi: 10.1002/advs.202104435
Baidu ScholarGoogle Scholar
[11] H. Mayer, R. Nossek,

Die entwicklung der leitfahigkeit und des ausseren lichtelektrischen effektes beim ubergang vom eibzelatom zum kompakten metall

. Z. Physik. 138, 353-362 (1954). doi: 10.1007/BF01340681
Baidu ScholarGoogle Scholar
[12] H. Mayer, R. Nossek, H. Thomas,

Le libre parcours moyen des électrons de conductibilité et des électrons photoélectriques mesuré au moyen de la méthode des couches minces

. J. Phys. Radium. 17, 204-209 (1956). doi: 10.1051/jphysrad:01956001703020400
Baidu ScholarGoogle Scholar
[13] Photoemissive Materials: Preparation, Properties, Uses, 1th edition, edited by Sommer A. H., published by John Wiley and Sons, Inc (1968), pages 38-58.
[14] F. Salvat, L. Barjuan, P. Andreo,

Inelastic collisions of fast charged particles with atoms: Bethe asymptotic formulas and shell corrections

. Phys. Rev. A 105(4), 042813 (2022). doi: 10.1103/PhysRevA.105.042813
Baidu ScholarGoogle Scholar
[15] S. Biswas, B. Förg, L. Ortmann et al.,

Probing molecular environment through photoemission delays

. Nat. Phys. 16(7), 1-6 (2020). doi: 10.1038/s41567-020-0887-8
Baidu ScholarGoogle Scholar
[16] H. J. Liu, J. C. Wang, D. Y. Cho et al.,

Giant photoresponse in quantized SrRuO3 monolayer at oxide interfaces

. ACS. Photonics. 5, 1041-1049 (2018). doi: 10.1021/acsphotonics.7b01339
Baidu ScholarGoogle Scholar
[17] D. Sier, G. P. Cousland, R. M. Trevorah, et al.,

High accuracy determination of photoelectric cross sections, X-ray absorption fine structure and nanostructure analysis of zinc selenide using the X-ray extended range technique

. J. Synchrotron. Rad. 27, 1262-1277 (2020). doi: 10.1107/S1600577520010097
Baidu ScholarGoogle Scholar
[18] R. Prasad,

Total photon-absorption cross-section measurements at 52.4, 60, 72.2, and 84.4 keV in Al, Fe, Mo, Ag, W, and Pt: Photoelectric cross sections deduced

. Phys. Rev. A. 18(5), 2167-2169 (1978). doi: 10.1103/PhysRevA.18.2167
Baidu ScholarGoogle Scholar
[19] M. C. Han, H. S. Kim, M. G. Pia, et al.,

Validation of cross sections for Monte Carlo simulation of the photoelectric effect

. IEEE. T. Nucl. Sci. 63(2), 1117-1146 (2016). doi: 10.1109/TNS.2016.2521876
Baidu ScholarGoogle Scholar
[20] W. F. Krolikowski, W. E. Spicer,

Photoemission studies of the noble metals. II. Gold

. Phys. Rev. B. 1(2): 478, (1970). doi: 10.1103/PhysRevB.1.478
Baidu ScholarGoogle Scholar
[21] A. J. Blodgett, W. E. Spicer,

Experimental determination of the density of states in nickel

. Phys. Rev. 146, 390-402 (1966). doi: 10.1103/PhysRev.146.390
Baidu ScholarGoogle Scholar
[22] R. U. Martinelli,

Secondary emission and photoemission from negative electron affinity GaP: Cs

. J. Appl. Phys. 45, 3203-3204 (1974). doi: 10.1063/1.1663751
Baidu ScholarGoogle Scholar
[23] D. G. Fisher, R. E. Enstrom, J. S. Escher, et al.,

Photoelectron surface escape probability of (Ga, In)As: Cs-O in the 0.9 to [inverted lazy s]1.6 μm range

. J. Appl. Phys. 43, 3815-3823 (1972). doi: 10.1063/1.1661817
Baidu ScholarGoogle Scholar
[24] R. U. Martinelli, M. Ettenberg,

Electron transport and emission characteristics of negative electron affinity AlxGa1−x As alloys (0≤x≤0.3)

. J. Appl. Phys. 45, 3896-3898 (1974). doi: 10.1063/1.1663882
Baidu ScholarGoogle Scholar
[25] W. F. Krolikowski, W. E. Spicer,

Photoemission studies of the noble metals. I. Copper

. Phys. Rev. 185, 882-900 (1969). doi: 10.1103/PhysRev.185.882
Baidu ScholarGoogle Scholar
[26] Photon Optics, 1th edition, edited by Li G. C, published by National defense industry Press (2010), page 147.
[27] D. H. Dowell, F. K. King, R. E. Kirby, et al.,

In situ cleaning of metal cathodes using a hydrogen ion beam

. Phys. Rev. Spec. Top. Accel. Beams. 9, 063502 (2006). doi: 10.1103/PhysRevSTAB.9.063502
Baidu ScholarGoogle Scholar
[28] S. V. Nayak, N. M. Badiger,

Measurement of K-shell photoelectric absorption parameters of Hf, Ta, Au, and Pb by an alternative method using a weak β-particle source

. Phys. Rev. A 73(3), 032707-032707 (2006). doi: 10.1103/PhysRevA.73.032707
Baidu ScholarGoogle Scholar
[29] K. S. Puttaswamy, R. Gowda, B. Sanjeevaiah,

Photoelectric cross sections derived from the total absorption cross sections in the energy range 5-130 keV

. Can. J. Phys. 57(1), 92-98 (1979). doi: 10.1139/p79-011
Baidu ScholarGoogle Scholar
[30] C.Y. Fong, M.L. Cohen,

Energy Band Structure of Copper by the Empirical Pseudopotential Method

. Phys. Rev. Lett. 24(7), 306-309 (1969). doi: 10.1103/PhysRevLett.24.306
Baidu ScholarGoogle Scholar
[31] E. C. Snow,

Self-Consistent Energy Bands of Metallic Copper by the Augmented-Plane-Wave Method. II

. Phys. Rev. 157(3), 570-578 (1968). doi: 10.1103/PhysRev.171.785
Baidu ScholarGoogle Scholar
[32] R. Shimizu, K. Goto,

On the energy distribution of secondary electrons emitted from metals

. J. Surf. Anal. 15(2), 186-194 (2008). doi: 10.1384/jsa.15.186
Baidu ScholarGoogle Scholar
[33] M. S. Chung,

Improved calculations of secondary electron energy distributions of metals

. J. Appl. Phys. 46, 465 (1975). doi: 10.1063/1.321362
Baidu ScholarGoogle Scholar
[34] A. G. Xie, L. Wang, L. H. Mu,

Formula for maximum secondary electron yield from metals

. Surf. Rev. Lett. 22, 1550019 (2015). doi: 10.1142/S0218625X15500195
Baidu ScholarGoogle Scholar
[35] A. G. Xie, H. S. Uhm, Y. Y. Chen,

et al. Maximum secondary electron yield and parameters of secondary electron yield of metals

. Surf. Rev. Lett. 23, 1650039 (2016) doi: 10.1142/S0218625X16500396
Baidu ScholarGoogle Scholar
[36] P. A. Wolff,

Theory of secondary electron cascade in metals

. Phys. Rev. 95, 56 (1954). doi: 10.1103/PhysRev.95.56
Baidu ScholarGoogle Scholar
[37] A. G. Xie, H. J. Dong, Z. Pan,

An electron-induced secondary electron model for photoelectric sensitivity and quantum efficiency of metal surfaces

. Results. Phys. 26, 104350 (2021). doi: 10.1016/j.rinp.2021.104350
Baidu ScholarGoogle Scholar
[38] J. O. D. Williams, J. S. Lapington, S. A. Leach, et al.,

Using quantum entangled photons to measure the absolute photon detection efficiency of a multi-pixel SiPM array

. Nucl. Instrum. Methods. Phys. Res. Sect. A 958, 8 (2020). doi: 10.1016/j.nima.2019.05.008
Baidu ScholarGoogle Scholar
[39] W. Xu, X. Hou, Y. Meng, et al.,

Deciphering Charging Status, Absolute Quantum Efficiency, and Absorption Cross Section of Multicarrier States in Single Colloidal Quantum Dots

. Nano. Lett. 17, 7487-7493 (2017). doi: 10.1021/acs.nanolett.7b03399
Baidu ScholarGoogle Scholar
[40] H.M. Cobb, Dictionary of Metals, 1st edn. (ASM international, 2012), pp. 336-340
[41] H. Seiler,

Secondary electron emission in the scanning electron microscope

. J. Appl. Phys. 54, R1 (1983). doi: 10.1063/1.332840
Baidu ScholarGoogle Scholar
[42] A. G. Xie, H. Y. Wu, J. Xu,

Parameters of the secondary electron yield from metal

. J. Korean. Phys. Soc. 62(5), 725-730 (2013). doi: 10.3938/jkps.62.725
Baidu ScholarGoogle Scholar
[43] A. G. Xie, K. Zhon, D. L. Zhao, et al.,

Formulae for low-energy secondary electron yield from different kinds of emitters as a function of measurable variables

. Mod. Phys. Lett. B31(10), 1750105 (2017). doi: 10.1142/S0217984917501056
Baidu ScholarGoogle Scholar
[44] A. G. Xie, Y. J. Yao, J. Su, et al.,

A universal formula for secondary electron yield from metals

. Nucl. Instrum. Methods. Res. Sect. B 268(17-18), 2565-2570 (2010). doi: 10.1016/j.nimb.2010.06.012
Baidu ScholarGoogle Scholar
[45] J. Llacer, E. L. Garwin,

Electron-Phonon Interaction in Alkali Halides. I. The Transport of Secondary Electrons with Energies between 0.25 and 7.5 eV

. J. Appl. Phys. 40, 2766 (1969). doi: 10.1063/1.1658075
Baidu ScholarGoogle Scholar
[46] A. G. Xie, H. J. Dong, Z. Pan,

Electron-insulator interaction and secondary electron yield at any Kelvin temperature

. Results. Phys. 28, 104554 (2021). doi: 10.1016/j.rinp.2021.104554
Baidu ScholarGoogle Scholar