Influencing factors on local reduction of graphene oxide with a heated AFM tip

INTERDISCIPLINARY STUDIES

Influencing factors on local reduction of graphene oxide with a heated AFM tip

WU Zhongliang，

SHEN Yue，

ZHOU Xingfei ，

GUO Shouwu，

ZHANG Yi

Nuclear Science and Techniques

Vol.22, No.4

pp.245-250

Published in print 20 Aug 2011

DOI：10.13538/j.1001-8042/nst.22.245-250

31101

In this paper, the factors influencing the local thermal reduction of graphene oxide (GO) sheets are investigated. The lateral force microscopy and scanning polarization force microscopy verify that the heated tips of atomic force microscope (AFM) can thermally reduce the GO into electrical conductive nanostructures. The tip temperature, heating time, and loading force applied by the AFM tip are found to have important effects on the thermal reduction of GO, while the environmental humidity is negligible.

Graphene oxideAtomic force microscopeHeatable tipReduction

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