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EXAFS and SR-XRD study on Cu occupation sites in Zn1-xCuxOdiluted magnetic semiconductors

SYNCHROTRON SCIENCE AND TECHNOLOGY

EXAFS and SR-XRD study on Cu occupation sites in Zn1-xCuxOdiluted magnetic semiconductors

YANG Chen
ZHANG Bin
WANG Jianzhong
SHI Liqun
CHENG Huansheng
YANG Tieying
WEN Wen
HU Fengchun
Nuclear Science and TechniquesVol.23, No.2pp.65-69Published in print 20 Apr 2012
29500

ZnO films, doped with 2.9 atom% Cu, were prepared by radio frequency magnetron sputtering on sapphire substrate at different substrate temperatures. No magnetic impurities such as Fe, Co and Ni were found in the PIXE spectra. The ZnO:Cu films possessed the wurtzite ZnO structure. No precipitates such as CuO and Cu2O or Cu cluster, were observed by synchrotron radiation X-ray diffraction in the ZnO:Cu films. Extended X-ray absorption fine structure (EXAFS) analysis showed that Cu atoms were incorporated into ZnO crystal lattice by occupying the sites of Zn atoms.

EXAFSSR-XRDPIXECu occupationsZnO DMS
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